CY7C1363C-133AJXI Cypress Semiconductor Corp, CY7C1363C-133AJXI Datasheet - Page 21

CY7C1363C-133AJXI

CY7C1363C-133AJXI

Manufacturer Part Number
CY7C1363C-133AJXI
Description
CY7C1363C-133AJXI
Manufacturer
Cypress Semiconductor Corp

Specifications of CY7C1363C-133AJXI

Format - Memory
RAM
Memory Type
SRAM - Synchronous
Memory Size
9M (512K x 18)
Speed
133MHz
Interface
Parallel
Voltage - Supply
3.135 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Package / Case
100-LQFP
Density
9Mb
Access Time (max)
6.5ns
Sync/async
Synchronous
Architecture
SDR
Clock Freq (max)
133MHz
Operating Supply Voltage (typ)
3.3V
Address Bus
19b
Package Type
TQFP
Operating Temp Range
-40C to 85C
Number Of Ports
2
Supply Current
250mA
Operating Supply Voltage (min)
3.135V
Operating Supply Voltage (max)
3.6V
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
100
Word Size
18b
Number Of Words
512K
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C1363C-133AJXI
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage temperature ............................... –65 °C to + 150 °C
Ambient temperature with
power applied .......................................... –55 °C to + 125 °C
Supply voltage on V
Supply voltage on V
DC voltage applied to outputs
in tri-state...........................................–0.5 V to V
DC input voltage .................................. –0.5 V to V
Current into outputs (LOW) ......................................... 20 mA
Static discharge voltage.......................................... > 2001 V
(per MIL-STD-883, method 3015)
Latch-up current .................................................... > 200 mA
Operating Range
Electrical Characteristics
Over the Operating Range
Document Number: 38-05541 Rev. *J
Commercial
Industrial
Automotive –40 °C to +125 °C
V
V
V
V
V
V
I
I
Notes
X
OZ
Parameter
16. Overshoot: V
17. T
DD
DDQ
OH
OL
IH
IL
Range
Power-up
: Assumes a linear ramp from 0 V to V
–40 °C to +85 °C
Power supply voltage
I/O supply voltage
Output HIGH voltage
Output LOW voltage
Input HIGH voltage
Input LOW voltage
Input leakage current
except ZZ and MODE
Input current of MODE
Input current of ZZ
Output leakage current
IH
0 °C to +70 °C
Temperature
(AC) < V
Ambient
DD
DDQ
Description
DD
relative to GND .......–0.5 V to + 4.6 V
relative to GND...... –0.5 V to + V
+1.5 V (Pulse width less than t
[16, 17]
[16]
[16]
3.3 V– 5% /
+ 10%
V
DD
for 3.3 V I/O
for 2.5 V I/O
for 3.3 V I/O, I
for 2.5 V I/O, I
for 3.3 V I/O, I
for 2.5 V I/O, I
for 3.3 V I/O
for 2.5 V I/O
for 3.3 V I/O
for 2.5 V I/O
GND  V
Input = V
Input = V
Input = V
Input = V
GND < V
DD
(min) within 200 ms. During this time V
DDQ
CYC
I
SS
DD
SS
DD
I
DD
2.5 V – 5%
 V
< V
/2), undershoot: V
to V
V
+ 0.5 V
+ 0.5 V
DDQ
DDQ,
OH
OH
OL
OL
DDQ
DD
=8.0 mA
= 1.0 mA
=4.0 mA
=1.0 mA
DD
output disabled
Test Conditions
IL
(AC) > –2 V (Pulse width less than t
Neutron Soft Error Immunity
LSBU
LMBU
SEL
* No LMBU or SEL events occurred during testing; this column represents a
statistical 
Application Note
of Terrestrial Failure Rates”
Parameter
IH
< V
DD
2
, 95% confidence limit calculation. For more details refer to
and V
AN54908 “Accelerated Neutron SER Testing and Calculation
Description
Single event
single-bit
DDQ
latch up
multi-bit
Logical
Logical
upsets
upsets
< V
CY7C1361C/CY7C1363C
DD
.
CYC
/2).
Conditions
25 °C
25 °C
85 °C
Test
3.135
3.135
2.375
–0.3
–0.3
Min
–30
2.4
2.0
2.0
1.7
–5
–5
–5
Typ Max* Unit
361
V
V
0
0
DD
DD
2.625
Max
V
3.6
0.4
0.4
0.8
0.7
+ 0.3 V
+ 0.3 V
30
Page 21 of 34
5
5
5
DD
0.01
394
0.1
Unit
FIT/
FIT/
FIT/
Dev
Mb
Mb
A
A
A
A
A
A
V
V
V
V
V
V
V
V
V
V
V
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