ADIS16334/PCBZ Analog Devices Inc, ADIS16334/PCBZ Datasheet - Page 17

• Manufacturer Part Number: ADIS16334/PCBZ
• Description: ADIS16334/PCB EVAL. BD. PB Free
• Manufacturer: Analog Devices Inc
• Series: iSensor™r

Specifications of ADIS16334/PCBZ

• Sensor Type: Gyroscope, 3 Axis
• Sensing Range: ±75 ~ 300°/s
• Interface: Serial
• Sensitivity: 0.0125°/sec/LSB
• Embedded: No
• Utilized Ic / Part: ADIS16334
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Voltage - Supply: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Self-Test
The self-test function allows the user to verify the mechanical
integrity of each MEMS sensor. It applies an electrostatic force
to each sensor element, which results in mechanical displacement
that simulates a response to actual motion. Table 1 lists the
expected response for each sensor and provides pass/fail criteria.
Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the internal
self-test routine, which exercises all inertial sensors, measures
each response, makes pass/fail decisions, and reports them to
error flags in the DIAG_STAT register. MSC_CTRL[10] resets
itself to 0 after completing the routine. Zero rotation provides
results that are more reliable.
Memory Test
Setting MSC_CTRL[11] = 1 (DIN = 0xB508) performs a check-
sum verification of the flash memory locations. The pass/fail result
is loaded into DIAG_STAT[6].
Status
The error flags provide indicator functions for common
system level issues. All of the flags are cleared (set to 0) after
each DIAG_STAT register read cycle. If an error condition
remains, the error flag returns to 1 during the next sample
cycle. The DIAG_STAT[1:0] bits do not require a read of this
register to return to 0. If the power supply voltage goes back
into range, these two flags are cleared automatically.
Table 26. DIAG_STAT Bit Descriptions
Bit(s)
[15]
[14]
[13]
[12]
[11]
[10]
[9]
[8]
[7]
[6]
[5]
[4]
[3]
[2]
[1:0]
Description (Default = 0x0000)
Z-axis accelerometer self-test failure (1 = fail, 0 = pass)
Y-axis accelerometer self-test failure (1 = fail, 0 = pass)
X-axis accelerometer self-test failure (1 = fail, 0 = pass)
Z-axis gyroscope self-test failure (1 = fail, 0 = pass)
Y-axis gyroscope self-test failure (1 = fail, 0 = pass)
X-axis gyroscope self-test failure (1 = fail, 0 = pass)
Alarm 2 status (1 = active, 0 = inactive)
Alarm 1 status (1 = active, 0 = inactive)
SPI communication failure (1 = fail, 0 = pass)
Flash update failure (1 = fail, 0 = pass)
Not used
Flash test, checksum flag (1 = fail, 0 = pass)
Self-test diagnostic error flag (1 = fail, 0 = pass)
Sensor overrange (1 = fail, 0 = pass)
Not used
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DEVICE IDENTIFICATION
Table 27. LOT_ID1 and LOT_ID2 Bit Descriptions
Bits
[15:0]
Table 28. PROD_ID Bit Descriptions
Bits
[15:0]
Table 29. SERIAL_NUM Bit Descriptions
Bits
[15:0]
FLASH MEMORY MANAGEMENT
Set MSC_CTRL[11] = 1 (DIN = 0xB508) to run an internal
checksum test on the flash memory, which reports a pass/fail
result to DIAG_STAT[6]. The FLASH_CNT register (see Table 30)
provides a running count of flash memory write cycles. This is a
tool for managing the endurance of the flash memory. Figure 22
quantifies the relationship between data retention and junction
temperature.
Table 30. FLASH_CNT Bit Descriptions
Bits
[15:0]
600
450
300
150
0
30
Lot identification code
0x3FCE = 16,334 (decimal)
Serial number, lot specific
Binary counter for writing to flash memory
Description
Description
Description
Description
Figure 22. Flash/EE Memory Data Retention
40
55
JUNCTION TEMPERATURE (°C)
70
85
100
125
ADIS16334
135
150