MFRC52202HN1,151 NXP Semiconductors, MFRC52202HN1,151 Datasheet - Page 43
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MFRC52202HN1,151
Manufacturer Part Number
MFRC52202HN1,151
Description
IC READER 32-HVQFN
Manufacturer
NXP Semiconductors
Series
MIFARE®r
Datasheet
1.MFRC52201HN1157.pdf
(109 pages)
Specifications of MFRC52202HN1,151
Rf Type
Read / Write
Frequency
13.56MHz
Features
ISO14443-A / Mifare
Package / Case
32-VFQFN Exposed Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
935293912151
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MFRC52202HN1,151
Manufacturer:
NXP/恩智浦
Quantity:
20 000
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NXP Semiconductors
112132
Product data sheet
9.2.4.9 AnalogTestReg
Controls the pins AUX1 and AUX2
Table 119: AnalogTestReg register (address 38h); reset value: 00h
Table 120: Description of AnalogTestReg bits
[1]
Bit
7 to 4
3 to 0
Symbol
Access
Rights
Bit
Remark: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended
Symbol
AnalogSelAux1
AnalogSelAux2
7
AnalogSelAux1
Rev. 3.2 — 22 May 2007
6
Description
Controls the AUX pin.
Remark: All test signals are described in
Value
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
1111
r/w
Description
Tristate
Output of TestDAC1 (AUX1), output of TestDAC2 (AUX2)
Testsignal Corr1
Reserved
Testsignal MinLevel
Testsignal ADC channel I
Testsignal ADC channel Q
Reserved
Reserved, Testsignal for production test
Reserved
HIGH
LOW
TxActive
At 106 kbit/s: HIGH during Startbit, Databit, Parity and CRC.
At 212, 424 and 848 kbit/s: High during Data and CRC.
RxActive
At 106 kbit/s: High during Databit, Parity and CRC.
At 212, 424 and 848 kbit/s: High during Data and CRC.
Subcarrier detected
106 kbit/s: not applicable
212, 424 and 848 kbit/s: High during last part of Data and
CRC.
Test bus bit as defined by the TstBusBitSel in register
TestSel1Reg.
5
4
[1]
[1]
3
[1]
[1]
Section 19
AnalogSelAux2
2
Contactless Reader IC
r/w
[1]
MFRC522
© NXP B.V. 2007. All rights reserved.
“Testsignals”.
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