STM32F105VBH6 STMicroelectronics, STM32F105VBH6 Datasheet - Page 73

• Manufacturer Part Number: STM32F105VBH6
• Description: IC ARM CORTEX MCU 128KB 100LFBGA
• Manufacturer: STMicroelectronics
• Series: STM32r

Specifications of STM32F105VBH6

• Core Processor: ARM® Cortex-M3™
• Core Size: 32-Bit
• Speed: 72MHz
• Connectivity: CAN, I²C, IrDA, LIN, SPI, UART/USART, USB OTG
• Peripherals: DMA, POR, PWM, Voltage Detect, WDT
• Number Of I /o: 80
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Voltage - Supply (vcc/vdd): 2 V ~ 3.6 V
• Data Converters: A/D 16x12b; D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-LFBGA
• Core: ARM Cortex M3
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

STM32F105xx, STM32F107xx
Note:
Table 53.
1. ADC DC accuracy values are measured after internal calibration.
2. Based on characterization, not tested in production.
Table 54.
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted V
3. Based on characterization, not tested in production.
ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog input pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog input. It is recommended to
add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative currents.
Any positive injection current within the limits specified for I
Section 5.3.12
Symbol
Symbol
EO
EG
EO
EG
ED
ED
ET
EL
ET
EL
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
ADC accuracy - limited test conditions
ADC accuracy
does not affect the ADC accuracy.
Parameter
Parameter
(1) (2)
Doc ID 15274 Rev 5
f
f
V
T
Measurements made after
ADC calibration
f
f
V
Measurements made after
ADC calibration
PCLK2
ADC
PCLK2
ADC
A
DDA
DDA
= 25 °C
= 14 MHz, R
= 14 MHz, R
= 3 V to 3.6 V
= 2.4 V to 3.6 V
= 56 MHz,
= 56 MHz,
Test conditions
Test conditions
DD
, frequency and temperature ranges.
AIN
AIN
(1)
< 10 k,
< 10 k,
INJ(PIN)
Electrical characteristics
and I
±1.3
±0.5
±0.7
±0.8
±1.5
±1.5
±1.5
Typ
Typ
±1
±2
±1
INJ(PIN)
Max
Max
±1.5
±1.5
±1.5
±2.5
±1
±3
±2
±2
±5
±3
(2)
(3)
in
73/101
Unit
LSB
Unit
LSB