STM32F107RCT6TR STMicroelectronics, STM32F107RCT6TR Datasheet - Page 53
STM32F107RCT6TR
Manufacturer Part Number
STM32F107RCT6TR
Description
IC ARM CORTEX MCU 256KB 64LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet
1.STM32F105V8T6.pdf
(101 pages)
Specifications of STM32F107RCT6TR
Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
72MHz
Connectivity
CAN, Ethernet, I²C, IrDA, LIN, SPI, UART/USART, USB OTG
Peripherals
DMA, POR, PWM, Voltage Detect, WDT
Number Of I /o
51
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
64K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b; D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-LFQFP
Core
ARM Cortex M3
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
STM32F107RCT6TR
Manufacturer:
STMicroelectronics
Quantity:
10 000
STM32F105xx, STM32F107xx
Table 32.
5.3.11
Table 33.
1. Based on characterization results, not tested in production.
Table 34.
Symbol
V
V
Symbol
Symbol
S
ESD(HBM)
ESD(CDM)
EMI
LU
Parameter
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with SAE
IEC61967-2 standard which specifies the test board and the pin loading.
EMI characteristics
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
ESD absolute maximum ratings
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
●
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Electrical sensitivities
Peak level
Static latch-up class
Electrostatic discharge voltage
(human body model)
Electrostatic discharge voltage
(charge device model)
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
Parameter
Ratings
V
LQFP100 package
compliant with IEC61967-2
DD
3.3 V, T
Conditions
A
25 °C,
T
A
+105 °C conforming to JESD78A
Doc ID 15274 Rev 5
T
JESD22-A114
T
JESD22-C101
A
A
+25 °C conforming to
+25 °C conforming to
Conditions
130 MHz to 1GHz
frequency band
SAE EMI Level
30 to 130 MHz
0.1 to 30 MHz
Monitored
Conditions
2
II
Class Maximum value
8/48 MHz
Max vs. [f
26
25
9
4
Electrical characteristics
HSE
2000
8/72 MHz
500
/f
HCLK
13
31
9
4
II level A
]
Class
(1)
dBµV
Unit
53/101
Unit
-
V