SST25VF080B-50-4C-QAF Microchip Technology, SST25VF080B-50-4C-QAF Datasheet - Page 28

Flash 8M (1Mx8) 50MHz 2.7-3.6V Commercial

SST25VF080B-50-4C-QAF

Manufacturer Part Number
SST25VF080B-50-4C-QAF
Description
Flash 8M (1Mx8) 50MHz 2.7-3.6V Commercial
Manufacturer
Microchip Technology
Datasheet

Specifications of SST25VF080B-50-4C-QAF

Architecture
Sectored
Interface Type
4-Wire
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.7 V
Maximum Operating Current
15 mA
Mounting Style
SMD/SMT
Organization
4 KB x 256
Memory Type
SPI Flash
Memory Size
8 Mbit
Operating Temperature
+ 70 C
Package / Case
WSON
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SST25VF080B-50-4C-QAF
Manufacturer:
SST
Quantity:
20 000
Part Number:
SST25VF080B-50-4C-QAF-T
0
A Microchip Technology Company
©2011 Silicon Storage Technology, Inc.
Figure 25:Power-up Timing Diagram
Figure 26:AC Input/Output Reference Waveforms
AC test inputs are driven at V
ment reference points for inputs and outputs are V
times (10%
V
V
DD
DD
V
V
V
IHT
Max
Min
ILT
DD
90%) are <5 ns.
INPUT
Commands may not be accepted or properly
Chip selection is not allowed.
interpreted by the device.
IHT
(0.9V
V
V
HT
LT
28
DD
) for a logic “1” and V
REFERENCE POINTS
T
T
PU-READ
PU-WRITE
HT
(0.6V
8 Mbit SPI Serial Flash
DD
Device fully accessible
) and V
ILT
V
V
(0.1V
HT
LT
LT
DD
(0.4V
) for a logic “0”. Measure-
Note: V
SST25VF080B
DD
OUTPUT
V
V
V
). Input rise and fall
LT
IHT
ILT
HT
- V
- V
- V
- V
S71296-05-000
1296 PwrUp.0
LOW
HIGH
1296 IORef.0
INPUT
INPUT
Test
Test
Data Sheet
LOW Test
HIGH Test
Time
02/11

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