ADF7901BRU Analog Devices Inc, ADF7901BRU Datasheet - Page 5

• Manufacturer Part Number: ADF7901BRU
• Description: IC XMITTER OOK/FSK ISM 24TSSOP
• Manufacturer: Analog Devices Inc

Specifications of ADF7901BRU

• Frequency: 369.5 ~ 395.9MHz
• Applications: ISM
• Modulation Or Protocol: ASK, FSK, OOK
• Data Rate - Maximum: 50 kbps
• Power - Output: 7dBm ~ 12dBm
• Current - Transmitting: 26mA
• Data Interface: PCB, Surface Mount
• Antenna Connector: PCB, Surface Mount
• Voltage - Supply: 3V
• Operating Temperature: 0°C ~ 50°C
• Package / Case: 24-TSSOP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Features: -
• Memory Size: -

ABSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
V
RFVDD to GND
Digital I/O Voltage to GND
Operating Temperature Range
Storage Temperature Range
Maximum Junction Temperature
TSSOP θ
Lead Temperature, Soldering
Vapor Phase (60 sec)
Infrared (15 sec)
1
2
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
This device is a high performance, RF-integrated circuit with an ESD rating
of <1 kV. It is ESD sensitive. Take proper precautions for handling and
assembly.
GND = RF
DD
A
Industrial (B Version)
= 25°C, unless otherwise noted.
to GND
JA
GND
Thermal Impedance
2
= D
GND
= 0 V.
1
−0.3 V to +4.0 V
−0.3 V to V
Value
−0.3 V to +4.0 V
0°C to 50°C
−65°C to +125°C
125°C
150.4°C/W
235°C
240°C
DD
+ 0.3 V
Rev. A| Page 5 of 12
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ADF7901