SAK-XE167KM-48F80L AA Infineon Technologies, SAK-XE167KM-48F80L AA Datasheet - Page 100
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SAK-XE167KM-48F80L AA
Manufacturer Part Number
SAK-XE167KM-48F80L AA
Description
IC MCU 16BIT FLASH 144-LQFP
Manufacturer
Infineon Technologies
Series
XE16xr
Datasheet
1.SAF-XE167KM-48F80L_AA.pdf
(140 pages)
Specifications of SAK-XE167KM-48F80L AA
Core Processor
C166SV2
Core Size
16-Bit
Speed
80MHz
Connectivity
EBI/EMI, I²C, LIN, SPI, SSC, UART/USART, USI
Peripherals
I²S, POR, PWM, WDT
Number Of I /o
119
Program Memory Size
384KB (384K x 8)
Program Memory Type
FLASH
Ram Size
34K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
144-LFQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Other names
SP000628648
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Table 17
Parameter
Total capacitance
of an analog input
Switched capacitance
of an analog input
Resistance of
the analog input path
Total capacitance
of the reference input
Switched capacitance
of the reference input
Resistance of
the reference input path
1) TUE is tested at
2)
3) The limit values for
4) This parameter includes the sample time (also the additional sample time specified by STC), the time to
5) The broken wire detection delay against
6) The broken wire detection delay against
7) The total unadjusted error TUE is the maximum deviation from the ideal ADC transfer curve, not the sum of
8) Not subject to production test - verified by design/characterization.
9) These parameter values cover the complete operating range. Under relaxed operating conditions
Data Sheet
voltage range.
The specified TUE is valid only if the absolute sum of input overload currents on Port 5 or Port 15 pins (see
I
V
cases will be X000
setting.
determine the digital result and the time to load the result register with the conversion result.
Values for the basic clock
conversion rate of not more than 500 μs.
conversion rate of not more than 10 μs. This function is influenced by leakage current, in particular at high
temperature.
individual errors.
All error specifications are based on measurement methods standardized by IEEE 1241.2000.
(temperature, supply voltage) typical values can be used for calculation. At room temperature and nominal
supply voltage the following typical values can be used:
C
OV
AIN
AINTtyp
specification) does not exceed 10 mA, and if
may exceed
= 12 pF,
A/D Converter Characteristics (cont’d)
C
V
V
AINStyp
AREFx
AGND
H
f
or X3FF
ADCI
or
=
= 5 pF,
must not be exceeded when selecting the peripheral frequency and the prescaler
V
V
t
ADCI
DDPA
AREFx
H
, respectively.
depend on programming and are found in
,
Symbol
C
C
R
C
CC
C
CC
R
R
up to the absolute maximum ratings. However, the conversion result in these
V
AINtyp
AIN
AREF
AINT
AINS
AREFT
AREFS
AGND
CC
= 1.0 kΩ,
CC –
CC –
= 0 V. It is verified by design for all other voltages within the defined
CC –
V
V
AGND
AREF
XE167FM, XE167GM, XE167HM, XE167KM
Min.
–
–
–
is measured in numbers of consecutive precharge cycles at a
is measured in numbers of consecutive precharge cycles at a
V
C
AREF
100
AREFTtyp
XE166 Family Derivatives / Base Line
Limit Values
and
Typ.
–
–
–
–
–
–
V
= 15 pF,
AGND
remain stable during the measurement time.
C
Max.
10
4
2
15
7
2
AREFStyp
Table
= 10 pF,
Electrical Parameters
Unit Test
pF
pF
kΩ
pF
pF
kΩ
18.
R
AREFtyp
Condition
8)9)
8)9)
8)9)
8)9)
8)9)
8)9)
V2.0, 2009-03
= 1.0 kΩ.
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