SC5554MVR132 Freescale Semiconductor, SC5554MVR132 Datasheet - Page 8

no-image

SC5554MVR132

Manufacturer Part Number
SC5554MVR132
Description
MCU MPC5554 DP ONLY 416-PBGA
Manufacturer
Freescale Semiconductor
Series
MPC55xx Qorivvar
Datasheet

Specifications of SC5554MVR132

Core Processor
e200z6
Core Size
32-Bit
Speed
132MHz
Connectivity
CAN, EBI/EMI, SCI, SPI
Peripherals
DMA, POR, PWM, WDT
Number Of I /o
256
Program Memory Size
2MB (2M x 8)
Program Memory Type
FLASH
Ram Size
64K x 8
Voltage - Supply (vcc/vdd)
1.35 V ~ 1.65 V
Data Converters
A/D 40x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 125°C
Package / Case
416-PBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SC5554MVR132
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Electrical Characteristics
The thermal characterization parameter is measured in compliance with the JESD51-2 specification using
a 40-gauge type T thermocouple epoxied to the top center of the package case. Position the thermocouple
so that the thermocouple junction rests on the package. Place a small amount of epoxy on the thermocouple
junction and approximately 1 mm of wire extending from the junction. Place the thermocouple wire flat
against the package case to avoid measurement errors caused by the cooling effects of the thermocouple
wire.
References:
Semiconductor Equipment and Materials International
3081 Zanker Rd.
San Jose, CA., 95134
(408) 943-6900
MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global Engineering Documents at
800-854-7179 or 303-397-7956.
JEDEC specifications are available on the web at http://www.jedec.org.
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive
2. G. Kromann, S. Shidore, and S. Addison, “Thermal Modeling of a PBGA for Air-Cooled Applica-
3. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and
3.3
The MPC5554 is available in packaged form. Read the package options in
Information.”
3.4
1
2
3
8
Spec
EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03. Qualification testing was performed on the MPC5554
and applied to the MPC5500 family as generic EMI performance data.
Measured with the single-chip EMI program.
Measured with the expanded EMI program.
1
2
3
4
5
6
7
Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47–54.
tions,” Electronic Packaging and Production, pp. 53–58, March 1998.
Its Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212–220.
Scan range
Operating frequency
V
V
V
Maximum amplitude
Operating temperature
DD
DDSYN
PP
, V
Package
EMI (Electromagnetic Interference) Characteristics
operating voltages
DDEH
, V
Refer to
RC33
, V
DDA
, V
DD33
operating voltages
Section 4, “Mechanicals,”
Characteristic
, V
FLASH
, V
MPC5554 Microcontroller Data Sheet, Rev. 3.0
Table 4. EMI Testing Specifications
DDE
operating voltages
for pinouts and package drawings.
Minimum
0.15
1
Typical
1.5
3.3
5.0
Section 2, “Ordering
Freescale Semiconductor
Maximum
1000
f
14
32
MAX
25
2
3
dBuV
MHz
MHz
Unit
o
V
V
V
C

Related parts for SC5554MVR132