MC9S12XEQ512CAL Freescale Semiconductor, MC9S12XEQ512CAL Datasheet - Page 1206

• Manufacturer Part Number: MC9S12XEQ512CAL
• Description: MCU 16BIT 512K FLASH 112-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12XEQ512CAL

• Core Processor: HCS12X
• Core Size: 16-Bit
• Speed: 50MHz
• Connectivity: CAN, EBI/EMI, I²C, IrDA, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 91
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 4K x 8
• Ram Size: 32K x 8
• Voltage - Supply (vcc/vdd): 1.72 V ~ 5.5 V
• Data Converters: A/D 16x12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 112-LQFP
• No. Of I/o's: 91
• Eeprom Memory Size: 4KB
• Ram Memory Size: 32KB
• Cpu Speed: 50MHz
• No. Of Timers: 3
• No. Of Pwm Channels: 8
• Digital Ic Case Style: LQFP
• Rohs Compliant: Yes
• Processor Series: S12XE
• Core: HCS12
• Data Bus Width: 16 bit
• Data Ram Size: 32 KB
• Interface Type: CAN, SCI, SPI
• Maximum Clock Frequency: 50 MHz
• Number Of Programmable I/os: 91
• Number Of Timers: 25
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWHCS12
• Development Tools By Supplier: KIT33812ECUEVME, EVB9S12XEP100, DEMO9S12XEP100
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 12 bit, 16 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Appendix A Electrical Characteristics
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (e.g., either V
1
2
3
4
5
A.1.6
All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade
integrated circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
1206
Num
Beyond absolute maximum ratings device might be damaged.
The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply. The absolute
maximum ratings apply when the device is powered from an external source.
All digital I/O pins are internally clamped to V
Those pins are internally clamped to V
This pin is clamped low to V
10
11
12
13
14
15
1
2
3
4
5
6
7
8
9
I/O, regulator and analog supply voltage
Digital logic supply voltage
PLL supply voltage
NVM supply voltage
Voltage difference V
Voltage difference V
Digital I/O input voltage
Analog reference
EXTAL, XTAL
TEST input
Instantaneous maximum current
Instantaneous maximum current
Instantaneous maximum current
Maximum current
Storage temperature range
Single pin limit for all digital I/O pins
Single pin limit for EXTAL, XTAL
Single pin limit for TEST
Single pin limit for power supply pins
ESD Protection and Latch-up Immunity
2
2
DDX
SSX
SSPLL
to V
to V
, but not clamped high. This pin must be tied low in applications.
2
5
MC9S12XE-Family Reference Manual , Rev. 1.23
SSA
DDA
Rating
Table A-1. Absolute Maximum Ratings
SSPLL
4
and V
SSX
3
and V
DDPLL
DDX
.
, or V
SSA
and V
DDA
SS35
V
Symbol
V
∆
V
∆
RH,
V
V
.
DDPLL
T stg
V
V
VDDX
VSSX
V
DD35
TEST
I
I
I
DDF
I
DT
DV
DL
DD
ILV
D
IN
V
or V
1
RL
DD35
–0.25
–100
–0.3
–0.3
–0.3
–0.3
–6.0
–0.3
–0.3
–0.3
–0.3
–0.3
Min
–25
–25
–65
).
Freescale Semiconductor
+100
Max
2.16
2.16
2.16
10.0
+25
+25
155
6.0
3.6
0.3
0.3
6.0
6.0
0
Unit
mA
mA
mA
mA
°C
V
V
V
V
V
V
V
V
V
V