MC9S08AC48CFDE Freescale Semiconductor, MC9S08AC48CFDE Datasheet - Page 319

• Manufacturer Part Number: MC9S08AC48CFDE
• Description: IC MCU 8BIT 48K FLASH 48-QFN
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08AC48CFDE

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 38
• Program Memory Size: 48KB (48K x 8)
• Program Memory Type: FLASH
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 48-QFN
• Processor Series: S08AC
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 2 KB
• Interface Type: I2C, SCI, SPI
• Operating Supply Voltage: - 0.3 V to + 5.8 V
• Maximum Operating Temperature: + 125 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMO9S08AC60E, DEMOACEX, DEMOACKIT, DCF51AC256, DC9S08AC128, DC9S08AC16, DC9S08AC60, DEMO51AC256KIT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 8 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

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Freescale Semiconductor
Loss of reference frequency is the reference frequency detected internally, which transitions the ICG into self-clocked mode if it
is not in the desired range.
Loss of DCO frequency is the DCO frequency detected internally, which transitions the ICG into FLL bypassed external mode
(if an external reference exists) if it is not in the desired range.
This parameter is characterized before qualification rather than 100% tested.
Proper PC board layout procedures must be followed to achieve specifications.
This specification applies to the period of time required for the FLL to lock after entering FLL engaged internal or external modes.
If a crystal/resonator is being used as the reference, this specification assumes it is already running.
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V
a given interval.
See
Figure
A-9.
Average of Percentage Error
Figure A-9. Internal Oscillator Deviation from Trimmed Frequency
DDA
and V
MC9S08AC60 Series Data Sheet, Rev. 2
SSA
and variation in crystal oscillator frequency increase the C
Appendix A Electrical Characteristics and Timing Specifications
Variable
3 V
5 V
Jitter
percentage for
ICGOUT
.
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