MC9S08QG8MPBE Freescale Semiconductor, MC9S08QG8MPBE Datasheet - Page 289
![IC MCU 8K FLASH 16-PDIP](/photos/12/33/123397/mc9s08qg8mpbe_sml.jpg)
MC9S08QG8MPBE
Manufacturer Part Number
MC9S08QG8MPBE
Description
IC MCU 8K FLASH 16-PDIP
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet
1.MC9S08QG8CDTER.pdf
(314 pages)
Specifications of MC9S08QG8MPBE
Core Processor
HCS08
Core Size
8-Bit
Speed
20MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
12
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
512 x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
16-DIP (0.300", 7.62mm)
Processor Series
S08QG
Core
HCS08
Data Bus Width
8 bit
Data Ram Size
512 B
Interface Type
SCI/SPI
Maximum Clock Frequency
20 MHz
Number Of Programmable I/os
12
Number Of Timers
1
Maximum Operating Temperature
+ 125 C
Mounting Style
Through Hole
3rd Party Development Tools
EWS08
Development Tools By Supplier
DEMO9S08QG8E
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
For Use With
DEMO9S08QG8E - BOARD DEMO FOR MC9S08QG8
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
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1
The susceptibility performance classification is described in
Freescale Semiconductor
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
Result
A
B
C
D
E
Parameter
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
Table A-18. Susceptibility Performance Classification
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 5
Table A-17. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
Symbol
V
CS_EFT
package type
Conditions
V
T
A
DD
= +25
TBD
= 3.3V
Performance Criteria
o
C
Table
TBD crystal
f
TBD bus
OSC
/f
A-18.
BUS
Result
Appendix A Electrical Characteristics
A
B
C
D
Amplitude
(Min)
TBD
TBD
TBD
TBD
1
Unit
kV
287
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