MC9S08GT8ACFDE Freescale Semiconductor, MC9S08GT8ACFDE Datasheet - Page 233

IC MCU 8K FLASH 1K RAM 48-QFN

MC9S08GT8ACFDE

Manufacturer Part Number
MC9S08GT8ACFDE
Description
IC MCU 8K FLASH 1K RAM 48-QFN
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet

Specifications of MC9S08GT8ACFDE

Core Processor
HCS08
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
39
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-QFN
Processor Series
S08GT
Core
HCS08
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
I2C/SCI/SPI
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
39
Operating Supply Voltage
3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWS08
Development Tools By Supplier
M68EVB908GB60E, M68DEMO908GB60E
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
For Use With
M68DEMO908GB60E - BOARD DEMO MC9S08GB60M68EVB908GB60E - BOARD EVAL FOR MC9S08GB60
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
There are two other forms of error which are not specified which can also affect ATD accuracy. These are:
Freescale Semiconductor
of how straight the line is (how far it deviates from a straight line). The adjusted ideal transition
voltage is:
Zero scale error (E
and the ideal transition to that code. Normally, it is defined as the difference between the actual and
ideal transition to code $001, but in some cases the first transition may be to a higher code. The
ideal transition to any code is:
Full scale error (E
and the ideal transition to that code. Normally, it is defined as the difference between the actual and
ideal transition to code $3FF, but in some cases the last transition may be to a lower code. The ideal
transition to any code is:
Total unadjusted error (E
and the ideal straight-line transfer function. An alternate definition (with the same result) is the
difference between the actual transfer function and the ideal straight-line transfer function. This
measure of error includes inherent quantization error and all forms of circuit error (INL, DNL,
zero-scale, and full-scale) except input leakage error, which is not due to the ATD.
Input leakage error (E
the ideal transition to that code that is the result of input leakage across the real portion of the
impedance of the network that drives the analog input. This error is a system-observable error
which is not inherent to the ATD, so it is not added to total error. This error is:
Sampling error (E
Noise error (E
(noise source capacitively coupled directly on the signal) or power supply (V
and V
internal sources can be reduced (and specified operation achieved) by operating the ATD
conversion in wait mode and ceasing all IO activity. Reducing the error due to external sources is
dependent on system activity and board layout.
Adjusted Ideal Trans. V =
SS
) noise interfering with the ATD’s ability to resolve the input accurately. The error due to
N
Ideal Transition V =
Ideal Transition V =
) — The error due to noise on V
FS
S
ZS
) — The error due to inadequate time to charge the ATD circuitry
) — This is the difference between the transition voltage to the last valid code
) — This is the difference between the transition voltage to the first valid code
IL
) — This is the error between the transition voltage to the current code and
TU
E
IL
) — This is the difference between the transition voltage to a given code
MC9S08GT16A/GT8A Data Sheet, Rev. 1
(in V) = input leakage * R
(Current Code - 1/2)
(Current Code - 1/2)
(Current Code - 1/2)
2
N
2
2
N
N
AIN
, V
* ((V
AS
REFH
REFH
*(V
*(V
, or V
REFH
REFH
+ E
REFL
Analog-to-Digital Converter (S08ATDV3)
FS
– V
– V
) - (V
due to either direct coupling
REFL
REFL
REFL
)
)
DDAD
+ E
, V
ZS
SSAD
))
Eqn. 14-6
Eqn. 14-7
Eqn. 14-8
Eqn. 14-9
, V
DD
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