P87C52UBPN,112 NXP Semiconductors, P87C52UBPN,112 Datasheet - Page 23

IC 80C51 MCU 256 RAM 40DIP

P87C52UBPN,112

Manufacturer Part Number
P87C52UBPN,112
Description
IC 80C51 MCU 256 RAM 40DIP
Manufacturer
NXP Semiconductors
Series
87Cr
Datasheet

Specifications of P87C52UBPN,112

Core Processor
8051
Core Size
8-Bit
Speed
33MHz
Connectivity
EBI/EMI, UART/USART
Peripherals
POR
Number Of I /o
32
Program Memory Size
8KB (8K x 8)
Program Memory Type
OTP
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Oscillator Type
Internal
Operating Temperature
0°C ~ 70°C
Package / Case
40-DIP (0.600", 15.24mm)
Package
40PDIP
Device Core
80C51
Family Name
87C
Maximum Speed
33 MHz
Operating Supply Voltage
5 V
Data Bus Width
8 Bit
Number Of Programmable I/os
32
Interface Type
UART
Number Of Timers
3
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Data Converters
-
Other names
935253730112
P87C52UBPN
P87C52UBPN
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
T
NOTES:
1. Typical ratings are not guaranteed. The values listed are at room temperature, 5 V.
2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the V
3. Capacitive loading on ports 0 and 2 may cause the V
4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its
5. See Figures 22 through 25 for I
6. This value applies to T
7. Load capacitance for port 0, ALE, and PSEN = 100 pF, load capacitance for all other outputs = 80 pF.
8. Under steady state (non-transient) conditions, I
9. ALE is tested to V
10. Pin capacitance is characterized but not tested. Pin capacitance is less than 25 pF. Pin capacitance of ceramic package is less than 15 pF
11. To improve noise rejection a nominal 100 ns glitch rejection circuitry has been added to the RST pin, and a nominal 15 ns glitch rejection
2000 Aug 07
amb
SYMBOL
SYMBOL
V
V
V
V
V
V
V
I
I
I
I
R
C
IL
TL
LI
CC
IL
IH
IH1
OL
OL1
OH
OH1
80C51 8-bit microcontroller family
4 K/8 K OTP/ROM low voltage (2.7 V–5.5 V),
low power, high speed (33 MHz), 128/256 B RAM
RST
IO
to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the
worst cases (capacitive loading > 100 pF), the noise pulse on the ALE pin may exceed 0.8 V. In such cases, it may be desirable to qualify
ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. I
single output sinks more than 5mA and no more than two outputs exceed the test conditions.
address bits are stabilizing.
maximum value when V
If I
test conditions.
(except EA is 25 pF).
circuitry has been added to the INT0 and INT1 pins. Previous devices provided only an inherent 5 ns of glitch rejection.
= 0 C to +70 C or –40 C to +85 C, 33 MHz devices; 5 V 10%; V
OL
Active mode:
Idle mode:
Maximum I
Maximum I
Maximum total I
exceeds the test condition, V
Input low voltage
Input high voltage (ports 0, 1, 2, 3, EA)
Input high voltage, XTAL1, RST
Output low voltage, ports 1, 2, 3
Output low voltage, port 0, ALE, PSEN
Output high voltage, ports 1, 2, 3
Output high voltage (port 0 in external bus
mode), ALE
Logical 0 input current, ports 1, 2, 3
Logical 1-to-0 transition current, ports 1, 2, 3
Input leakage current, port 0
Power supply current (see Figure 21):
Internal reset pull-down resistor
Pin capacitance
Active mode (see Note 5)
Idle mode (see Note 5)
Power-down mode or clock stopped (see Fig-
OL
OL
ure 25 for conditions)
per port pin:
per 8-bit port:
OH1
25 f
OL
I
I
CC(MAX)
CC(MAX)
9
, except when ALE is off then V
amb
for all outputs:
, PSEN
IN
PARAMETER
PARAMETER
10
is approximately 2 V.
= 0 C to +70 C. For T
11
(except EA)
diti
= 0.9
= 0.18
3
CC
test conditions.
OL
)
FREQ. + 1.1 mA
may exceed the related specification. Pins are not guaranteed to sink current greater than the listed
FREQ. +1.0 mA; See Figure 21.
15 mA (*NOTE: This is 85 C specification.)
26 mA
71 mA
11
8
3
OL
amb
7, 8
must be externally limited as follows:
= –40 C to +85 C, I
OH
OH
6
on ALE and PSEN to momentarily fall below the V
is the voltage specification.
T
0.45 < V
amb
4.5 V < V
T
amb
CONDITIONS
I
I
I
I
OH
= –40 C to +85 C
V
OL
V
OL
V
V
OH
V
V
See note 4
See note 5
CC
CC
CC
CC
= 0 C to 70 C
IN
IN
SS
23
TEST
= 1.6mA
= 3.2mA
= –3.2mA
IN
= –30 A
= 0.4 V
= 2.0 V
= 4.5 V
= 4.5 V
= 4.5 V
= 4.5 V
CC
< V
= 0 V
TL
< 5.5 V
CC
= –750 A.
2
2
– 0.3
0.2 V
V
V
80C51/87C51/80C52/87C52
0.7 V
CC
CC
OL
–0.5
MIN
OL
–1
40
CC
– 0.7
– 0.7
s of ALE and ports 1 and 3. The noise is due
can exceed these conditions provided that no
CC
+0.9
LIMITS
TYP
CC
3
1
–0.7 specification when the
0.2 V
V
V
CC
CC
MAX
–650
–50
225
0.4
0.4
Product specification
50
75
15
CC
10
+0.5
+0.5
–0.1
UNIT
UNIT
k
pF
V
V
V
V
V
V
V
A
A
A
A
A

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