AT91SAM7X512-AU-999 Atmel, AT91SAM7X512-AU-999 Datasheet - Page 47

• Manufacturer Part Number: AT91SAM7X512-AU-999
• Description: IC MCU ARM 512K HS FLASH 100LQFP
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM7X512-AU-999

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 55MHz
• Connectivity: CAN, Ethernet, I²C, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Number Of I /o: 62
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Ram Size: 128K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-LQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

12.3.2
12.4
6120H–ATARM–17-Feb-09
Debug and Test Pin Description
Test Environment
Figure 12-3
ter. In this example, the “board in test” is designed using a number of JTAG-compliant devices.
These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
JTAGSEL
DRXD
DTXD
shows a test environment example. Test vectors are sent and interpreted by the tes-
Debug and Test Pin List
AT91SAM7Xxx-based Application Board In Test
AT91SAM7X512/256/128 Preliminary
Connector
ICE/JTAG
AT91SAM7Xxx
Interface
JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
JTAG Selection
Debug Receive Data
Debug Transmit Data
Chip n
ICE and JTAG
Test Adaptor
Debug Unit
Reset/Test
Chip 2
Chip 1
Tester
Input/Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Active Level
High
Low
47