ATMEGA1280V-8CUR Atmel, ATMEGA1280V-8CUR Datasheet - Page 296
![MCU AVR 128K FLASH 8MHZ 100CBGA](/photos/6/89/68968/313-100-cbga_sml.jpg)
ATMEGA1280V-8CUR
Manufacturer Part Number
ATMEGA1280V-8CUR
Description
MCU AVR 128K FLASH 8MHZ 100CBGA
Manufacturer
Atmel
Series
AVR® ATmegar
Specifications of ATMEGA1280V-8CUR
Core Processor
AVR
Core Size
8-Bit
Speed
8MHz
Connectivity
EBI/EMI, I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
86
Program Memory Size
128KB (64K x 16)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-TFBGA
Data Bus Width
8 bit
Data Ram Size
8 KB
Mounting Style
SMD/SMT
For Use With
ATSTK600-TQFP100 - STK600 SOCKET/ADAPTER 100-TQFPATSTK503 - STARTER KIT AVR EXP MODULE 100P
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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26. JTAG Interface and On-chip Debug System
26.1
26.2
2549M–AVR–09/10
Features
Overview
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The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
•
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A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
ming via the JTAG Interface” on page 354
302, respectively. The On-chip Debug support is considered being private JTAG instructions,
and distributed within ATMEL and to selected third party vendors only.
Figure 26-1 on page 297
system. The TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP
Controller selects either the JTAG Instruction Register or one of several Data Registers as the
scan chain (Shift Register) between the TDI – input and TDO – output. The Instruction Register
holds JTAG instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used
for board-level testing. The JTAG Programming Interface (actually consisting of several physical
and virtual Data Registers) is used for serial programming via the JTAG interface. The Internal
Scan Chain and Break Point Scan Chain are used for On-chip debugging only.
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
Extensive On-chip Debug Support for Break Conditions, Including
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Break Points on Single Address or Address Range
– Data Memory Break Points on Single Address or Address Range
Testing PCBs by using the JTAG Boundary-scan capability.
Programming the non-volatile memories, Fuses and Lock bits.
On-chip debugging.
shows a block diagram of the JTAG interface and the On-chip Debug
ATmega640/1280/1281/2560/2561
and
®
“IEEE 1149.1 (JTAG) Boundary-scan” on page
“Program-
296
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