AT90CAN32-16AUR Atmel, AT90CAN32-16AUR Datasheet - Page 293

• Manufacturer Part Number: AT90CAN32-16AUR
• Description: MCU AVR 32K FLASH 16MHZ 64-TQFP
• Manufacturer: Atmel
• Series: AVR® 90CANr

Specifications of AT90CAN32-16AUR

• Core Processor: AVR
• Core Size: 8-Bit
• Speed: 16MHz
• Connectivity: CAN, EBI/EMI, I²C, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Number Of I /o: 53
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 1K x 8
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-TQFP, 64-VQFP
• Data Bus Width: 8 bit
• Mounting Style: SMD/SMT
• For Use With: ATSTK600 - DEV KIT FOR AVR/AVR32ATDVK90CAN1 - KIT DEV FOR AT90CAN128 MCU
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

22. JTAG Interface and On-chip Debug System
22.1
22.2
22.3
7679H–CAN–08/08
Features
Overview
Test Access Port – TAP
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The AVR IEEE std. 1149.1 compliant JTAG interface can be used for:
A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
Programming Overview” on page 352
respectively. The On-chip Debug support is considered being private JTAG instructions, and dis-
tributed within ATMEL and to selected third party vendors only.
Figure 22-1
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI – input and TDO – output. The Instruction Register holds JTAG
instructions controlling the behavior of a Data Register.
The ID-Register (IDentifier Register), Bypass Register, and the Boundary-scan Chain are the
Data Registers used for board-level testing. The JTAG Programming Interface (actually consist-
ing of several physical and virtual Data Registers) is used for serial programming via the JTAG
interface. The Internal Scan Chain and Break Point Scan Chain are used for On-chip debugging
only.
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
• Testing PCBs by using the JTAG Boundary-scan capability
• Programming the non-volatile memories, Fuses and Lock bits
• On-chip debugging
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
Extensive On-chip Debug Support for Break Conditions, Including
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
machine.
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Break Points on Single Address or Address Range
– Data Memory Break Points on Single Address or Address Range
shows a block diagram of the JTAG interface and the On-chip Debug system. The
and
“Boundary-scan IEEE 1149.1 (JTAG)” on page
®
AT90CAN32/64/128
“JTAG
300,
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