STM32F103VBH6 STMicroelectronics, STM32F103VBH6 Datasheet - Page 41

MCU ARM 128KB FLASH MEM 100-LFBG

STM32F103VBH6

Manufacturer Part Number
STM32F103VBH6
Description
MCU ARM 128KB FLASH MEM 100-LFBG
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F103VBH6

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
72MHz
Connectivity
CAN, I²C, IrDA, LIN, SPI, UART/USART, USB
Peripherals
DMA, Motor Control PWM, PDR, POR, PVD, PWM, Temp Sensor, WDT
Number Of I /o
80
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
20K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-LFBGA
Processor Series
STM32F103x
Core
ARM Cortex M3
Data Bus Width
32 bit
Data Ram Size
20 KB
Interface Type
CAN, I2C, SPI, USART, USB
Maximum Clock Frequency
72 MHz
Number Of Programmable I/os
100
Number Of Timers
3 x 16 bit
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 105 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWARM, EWARM-BL, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
ST-LINK
Minimum Operating Temperature
- 40 C
On-chip Adc
12 bit x 2, 16 Channel
For Use With
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Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
497-6069

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STM32F103xx
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with SAE J
1752/3 standard which specifies the test board and the pin loading.
Table 26.
Symbol Parameter
S
EMI
Peak level
EMI characteristics
V
LQFP100 package
compliant with SAE J
1752/3
DD
= 3.3 V, T
Conditions
A
= 2 5 °C ,
130 MHz to 1GHz
Frequency Band
SAE EMI Level
30 to 130 MHz
0.1 to 30 MHz
Monitored
Max vs. [f
8/48 MHz 8/72 MHz
Electrical characteristics
12
22
23
4
HSE
/f
12
19
29
HCLK
4
]
dBµV
Unit
41/67
-

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