AD5520JST Analog Devices Inc, AD5520JST Datasheet - Page 7

• Manufacturer Part Number: AD5520JST
• Description: IC SNGL PARAMETRIC MEASURE64LQFP
• Manufacturer: Analog Devices Inc
• Type: Per-pin Parametric Measurement Unit (PPMU)r

Specifications of AD5520JST

• Rohs Status: RoHS non-compliant
• Applications: Automatic Test Equipment
• Mounting Type: Surface Mount
• Package / Case: 64-LQFP
• Operating Temperature (min): 0C
• Operating Temperature (max): 70C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• For Use With: EVAL-AD5520EBZ - BOARD EVAL FOR AD5520
• Lead Free Status / RoHS Status: Not Compliant

ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
AV
AV
AV
DV
Digital Inputs to DGND
Analog Inputs to AGND
CLH to CLL
CPH to CPL
REFGND, DGND
Operating Temperature Range
Storage Temperature Range
Maximum Junction Temperature,
Package Power Dissipation
Thermal Impedance θ
Lead Temperature
IR Reflow, Peak Temperature
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
A
Commercial (J Version)
(T
(Soldering 10 sec)
CC
CC
EE
DD
= 25°C, unless otherwise noted.
J
to AGND
to AV
to AGND
max)
EE
JA
Rating
34 V
−0.3 V, +17 V
+0.3 V, −17 V
−0.3 V to +6 V
−0.3 V to DV
AV
−0.3 V to +34 V
−0.3 V to +34 V
AV
0°C to 70°C
−65°C to +150°C
150°C
(T
47.8°C /W
300°C
220°C
J
CC
CC
max – T
+ 0.3 V to AV
+ 0.3 V to AV
A
)/θ
DD
JA
+ 0.3 V
EE
EE
– 0.3 V
– 0.3 V
Rev. B | Page 7 of 24
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
AD5520