ADE7760ARSRL Analog Devices Inc, ADE7760ARSRL Datasheet - Page 6

• Manufacturer Part Number: ADE7760ARSRL
• Description: IC ENERGY METER W/OCFD 20SSOP TR
• Manufacturer: Analog Devices Inc

Specifications of ADE7760ARSRL

• Rohs Status: RoHS non-compliant
• Input Impedance: 400 KOhm
• Measurement Error: 0.1%
• Voltage - I/o High: 2.4V
• Voltage - I/o Low: 0.8V
• Current - Supply: 4mA
• Voltage - Supply: 4.75 V ~ 5.25 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 20-SSOP (0.200", 5.30mm Width)
• Meter Type: Single Phase
• Lead Free Status / Rohs Status: Not Compliant

ADE7760
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
Analog Input Voltage to AGND
Reference Input Voltage to AGND
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
20-Lead SSOP, Power Dissipation
θ
Lead Temperature, Soldering
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
JA
DD
A
V
Industrial
Vapor Phase (60 s)
Infrared (15 s)
= 25°C, unless otherwise noted.
Thermal Impedance
to AGND
1AP
, V
1BP
, V
1N
, V
2N
, V
2P
Rating
–0.3 V to +7 V
–6 V to +6 V
–0.3 V to V
–0.3 V to V
–0.3 V to V
–40°C to +85°C
–65°C to +150°C
150°C
450 mW
112°C/W
215°C
220°C
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. 0 | Page 6 of 24
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.