K4H280438F SAMSUNG [Samsung semiconductor], K4H280438F Datasheet

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K4H280438F

Manufacturer Part Number
K4H280438F
Description
128Mb F-die DDR SDRAM Specification
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet
DDR SDRAM 128Mb F-die (x4, x8)
DDR SDRAM
128Mb F-die DDR SDRAM Specification
Revision 1.1
May 2004
Rev. 1.1 May. 2004

Related parts for K4H280438F

K4H280438F Summary of contents

Page 1

... DDR SDRAM 128Mb F-die (x4, x8) 128Mb F-die DDR SDRAM Specification Revision 1.1 May 2004 DDR SDRAM Rev. 1.1 May. 2004 ...

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... DDR SDRAM 128Mb F-die (x4, x8) 128Mb F-die Revision History Revision 0.0 (January, 2004) - Target spec. release Revision 0.1 (February, 2004) - Modified DC current spec. Revision 1.0 (March, 2004) - Revision 1.0 spec. release. Revision 1.1 (May, 2004) - Corrected typo. DDR SDRAM Rev. 1.1 May. 2004 ...

Page 3

... Auto & Self refresh • 15.6us refresh interval(4K/64ms refresh) • Maximum burst refresh cycle : 8 • 66pin TSOP II package Ordering Information Part No. K4H280438F-TC/LA2 K4H280438F-TC/LB0 K4H280438F-TC/LA0 K4H280838F-TC/LB3 K4H280838F-TC/LA2 K4H280838F-TC/LB0 Operating Frequencies B3(DDR333@CL=2.5) Speed @CL2 Speed @CL2.5 *CL : CAS Latency Org ...

Page 4

... DDR SDRAM 128Mb F-die (x4, x8) Pin Description DDQ SSQ DDQ SSQ DDQ CAS CAS RAS RAS AP/A AP Organization ...

Page 5

... DDR SDRAM 128Mb F-die (x4, x8) Package Physical Dimension #66 #1 (1.50) (0.71) NOTE REFERENCE ASS’Y OUT QUALITY #34 #33 22.22±0.10 (10×) 0.65TYP 0.30±0.08 0.65±0.08 (10×) 66pin TSOPII / Package dimension DDR SDRAM Units : Millimeters (10×) (10×) +0.075 0.125 -0.035 0.10 MAX 0.25TYP [ ] 0.075 MAX 0× ...

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... DDR SDRAM 128Mb F-die (x4, x8) Block Diagram (8Mbit x 4 Bank Select CK, CK ADD LCKE LRAS LCBR CK, CK CKE / 4Mbit Banks) 4/8 CK, CK Data Input Register Serial to parallel 8/16 4Mx8/ 2Mx16 4Mx8/ 2Mx16 4Mx8/ 2Mx16 4Mx8/ 2Mx16 Column Decoder Latency & Burst Length ...

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... DDR SDRAM 128Mb F-die (x4, x8) Input/Output Function Description SYMBOL TYPE CK, CK Input CKE Input CS Input RAS, CAS, WE Input LDM,(UDM) Input BA0, BA1 Input 11] Input DQ I/O LDQS,(U)DQS I VDDQ Supply VSSQ Supply VDD Supply VSS Supply VREF Input Clock : CK and CK are differential clock inputs. All address and control input signals are sam- pled on the positive edge of CK and negative edge of CK ...

Page 8

... DM(x4/8) sampled at the rising and falling edges of the DQS and Data-in are masked at the both edges (Write DM latency is 0). UDM/LDM(x16 only) sampled at the rising and falling edges of the UDQS/LDQS and Data-in are masked at the both edges (Write UDM/LDM latency is 0). 9. This combination is not defined for any function, which means "No Operation(NOP)" in DDR SDRAM. CKEn-1 CKEn CS ...

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... Banks / 4M x 8Bit x 4 Banks Double Data Rate SDRAM General Description The K4H280438F / K4H280838F is 134,217,728 bits of double data rate synchronous DRAM organized as 4x 8,388,608 / 4x 4,194,304 words by 4/ 8bits, fabricated with SAMSUNG′s high performance CMOS technology. Synchronous features with Data Strobe allow extremely high performance up to 333Mb/s per pin ...

Page 10

... DDR SDRAM 128Mb F-die (x4, x8) DDR SDRAM Spec Items & Test Conditions Operating current - One bank Active-Precharge; tRC=tRCmin; tCK=7.5ns for DDR266, 6ns for DDR333; DQ,DM and DQS inputs changing once per clock cycle; address and control inputs changing once every two clock cycles. ...

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... IDD4W IDD5 Normal IDD6 Low power IDD7A Symbol B3(DDR333@CL=2.5) IDD0 IDD1 IDD2P IDD2F IDD2Q IDD3P IDD3N IDD4R IDD4W IDD5 Normal IDD6 Low power IDD7A 32Mx4 (K4H280438F) B0(DDR266@CL=2. 105 105 105 105 120 120 150 150 ...

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... DDR SDRAM 128Mb F-die (x4, x8) < Detailed test conditions for DDR SDRAM IDD1 & IDD7A > IDD1 : Operating current: One bank operation 1. Only one bank is accessed with tRC(min), Burst Mode, Address and Control inputs on NOP edge are changing once per clock cycle. lout = 0mA 2 ...

Page 13

... DDR SDRAM 128Mb F-die (x4, x8) AC Operating Conditions Parameter/Condition Input High (Logic 1) Voltage, DQ, DQS and DM signals Input Low (Logic 0) Voltage, DQ, DQS and DM signals. Input Differential Voltage, CK and /CK inputs Input Crossing Point Voltage, CK and /CK inputs Notes : 1. VID is the magnitude of the difference between the input level on CK and the input level on /CK. ...

Page 14

... DDR SDRAM 128Mb F-die (x4, x8) Overshoot/Undershoot specification for Data, Strobe, and Mask Pins Maximum peak amplitude allowed for overshoot Maximum peak amplitude allowed for undershoot The area between the overshoot signal and VDD must be less than or equal to The area between the undershoot signal and GND must be less than or equal to ...

Page 15

... DDR SDRAM 128Mb F-die (x4, x8) AC Timming Parameters & Specifications Parameter Row cycle time Refresh row cycle time Row active time RAS to CAS delay Row precharge time Row active to Row active delay Write recovery time Last data in to Read command Col. address to Col. address delay CL=2 ...

Page 16

... DDR SDRAM 128Mb F-die (x4, x8) Parameter Output DQS valid window Clock half period Data hold skew factor DQS write postamble time Active to Read with Auto precharge command Autoprecharge write recovery + Precharge time AC Operating Test Conditions (V =2.5V, V =2.5V 70°C) DD DDQ A Parameter ...

Page 17

... DDR SDRAM 128Mb F-die (x4, x8) System Characteristics for DDR SDRAM The following specification parameters are required in systems using DDR333, DDR266 devices to ensure proper system performance. these characteristics are for system simulation purposes and are guaranteed by design. Table 1 : Input Slew Rate for DQ, DQS, and DM ...

Page 18

... DQS will be tran sitioning from High logic LOW previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device. 5. For command/address input slew rate ≥ 1.0 V/ns 6. For command/address input slew rate ≥ ...

Page 19

... DDR SDRAM 128Mb F-die (x4, x8) b. Pulldown slew rate is measured under the test conditions shown in Figure 2. Output Figure 2 : Pulldown slew rate test load c. Pullup slew rate is measured between (VDDQ/2 - 320 mV +/- 250 mV) Pulldown slew rate is measured between (VDDQ/2 + 320 mV +/- 250 mV) Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs switching and only one output switching ...

Page 20

... DDR SDRAM Output Driver V-I Characteristics DDR SDRAM Output driver characteristics are defined for full and half strength operation as selected by the EMRS bit A1. Figures 3 and 4 show the driver characteristics graphically, and tables 8 and 9 show the same data in tabular format suitable for input into simulation tools ...

Page 21

... DDR SDRAM 128Mb F-die (x4, x8) Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 6.0 6.8 0.2 12.2 13.5 0.3 18.1 20.1 0.4 24.1 26.6 0.5 29.8 33.0 0.6 34.6 39.1 0.7 39.4 44.2 0.8 43.7 49.8 0.9 47.5 55.2 1.0 51.3 60.3 1.1 54.1 65.2 1.2 56.2 69.9 1.3 57.9 74.2 1.4 59.3 78.4 1.5 60.1 82.3 1.6 60.5 85.9 1.7 61.0 89.1 1.8 61.5 92.2 1.9 62.0 95.3 2.0 62.5 97.2 2.1 62.9 99.1 2.2 63.3 100.9 2.3 63.8 101.9 2.4 64.1 102.8 2.5 64.6 103.8 2.6 64.8 104.6 2.7 65.0 105.4 Minimum Maximum 4.6 9.6 9.2 18.2 13.8 26.0 18.4 33.9 23.0 41.8 27.7 49.4 32.2 56.8 36.8 63.2 39.6 69.9 42.6 76.3 44.8 82.5 46.2 88.3 47.1 93.8 47.4 99.1 47.7 103.8 48.0 108.4 48.4 112.1 48.9 115.9 49.1 119.6 49.4 123.3 49.6 126.5 49.8 129.5 49.9 132.4 50.0 135.0 50.2 137.3 50.4 139.2 50.5 140.8 Table 8. Full Strength Driver Characteristics DDR SDRAM pullup Current (mA) ...

Page 22

... DDR SDRAM 128Mb F-die (x4, x8 0.0 Pullup Characteristics for Weak Output Driver 0.0 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 Pulldown Characteristics for Weak Output Driver Figure 4. I/V characteristics for input/output buffers:Pull up(above) and pull down(below) 1.0 2.0 1.0 2.0 DDR SDRAM Maximum Typical High ...

Page 23

... DDR SDRAM 128Mb F-die (x4, x8) Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 3.4 3.8 0.2 6.9 7.6 0.3 10.3 11.4 0.4 13.6 15.1 0.5 16.9 18.7 0.6 19.6 22.1 0.7 22.3 25.0 0.8 24.7 28.2 0.9 26.9 31.3 1.0 29.0 34.1 1.1 30.6 36.9 1.2 31.8 39.5 1.3 32.8 42.0 1.4 33.5 44.4 1.5 34.0 46.6 1.6 34.3 48.6 1.7 34.5 50.5 1.8 34.8 52.2 1.9 35.1 53.9 2.0 35.4 55.0 2.1 35.6 56.1 2.2 35.8 57.1 2.3 36.1 57.7 2.4 36.3 58.2 2.5 36.5 58.7 2.6 36.7 59.2 2.7 36.8 59.6 Minimum Maximum 2.6 5.0 5.2 9.9 7.8 14.6 10.4 19.2 13.0 23.6 15.7 28.0 18.2 32.2 20.8 35.8 22.4 39.5 24.1 43.2 25.4 46.7 26.2 50.0 26.6 53.1 26.8 56.1 27.0 58.7 27.2 61.4 27.4 63.5 27.7 65.6 27.8 67.7 28.0 69.8 28.1 71.6 28.2 73.3 28.3 74.9 28.3 76.4 28.4 77.7 28.5 78.8 28.6 79.7 Table 9. Weak Driver Characteristics DDR SDRAM pullup Current (mA) Typical Typical Minimum Low High -3.5 -4.3 -2.6 -6.9 -8.2 -5.2 -10.3 -12.0 -7.8 -13.6 -15.7 -10.4 -16.9 -19.3 -13.0 -19.4 -22.9 -15.7 -21.5 -26.5 -18.2 -23.3 -30.1 -20.4 -24.8 -33.6 -21.6 -26.0 -37.1 -21.9 -27.1 -40.3 -22.1 -27.8 -43.1 -22.2 -28.3 -45.8 -22.3 -28.6 -48.4 -22.4 -28.7 -50.7 -22.6 -28.9 -52.9 -22.7 -28.9 -55.0 -22.7 -29.0 -56.8 -22.8 -29.2 -58.7 -22.9 -29.2 -60.0 -22.9 -29.3 -61.2 -23.0 -29.5 -62.4 -23.0 -29.5 -63.1 -23.1 -29.6 -63.8 -23.2 -29.7 -64.4 -23.2 -29.8 -65.1 -23.3 -29.9 -65.8 -23.3 Rev. 1.1 May. 2004 Maximum -5.0 -9.9 -14.6 -19.2 -23.6 -28.0 -32.2 -35.8 -39.5 -43.2 -46.7 -50.0 -53.1 -56.1 -58.7 -61.4 -63.5 -65.6 -67.7 -69.8 -71.6 -73.3 -74.9 -76.4 -77.7 -78.8 -79.7 ...

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