m470t2864qz3 Samsung Semiconductor, Inc., m470t2864qz3 Datasheet - Page 14

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m470t2864qz3

Manufacturer Part Number
m470t2864qz3
Description
Ddr2 Unbuffered Sodimm
Manufacturer
Samsung Semiconductor, Inc.
Datasheet

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Part Number:
m470t2864qz3-CE600
Manufacturer:
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Quantity:
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12.0 Input/Output Capacitance
* DM is internally loaded to match DQ and DQS identically.
13.0 Electrical Characteristics & AC Timing for DDR2-800/667
13.1 Refresh Parameters by Device Density
13.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin
SODIMM
Input capacitance, CK and CK
Input capacitance, CKE , CS, Addr, RAS, CAS, WE
Input/output capacitance, DQ, DM, DQS, DQS
Refresh to active/Refresh command time
Average periodic refresh interval
Bin
Parameter
tCK, CL=3
tCK, CL=4
tCK, CL=5
tCK, CL=6
tRCD
tRP
tRC
tRAS
(CL - tRCD - tRP)
(0 °C < T
Speed
OPER
Parameter
Parameter
Non-ECC
< 95 °C; V
DDQ
3.75
12.5
12.5
57.5
min
2.5
45
= 1.8V + 0.1V; V
5
-
DDR2-800(E7)
5 - 5 - 5
tRFC
tREFI
70000
max
Symbol
8
8
8
CCK
-
-
-
-
CIO
CI
DD
85 °C < T
0 °C ≤ T
= 1.8V + 0.1V)
Symbol
CASE
CASE
M470T5663QZ(H)3
14 of 19
3.75
min
Min
2.5
15
15
60
45
3
-
-
-
-
≤ 85°C
DDR2-800(F7)
≤ 95°C
6 - 6- 6
Max
48
42
9
70000
max
256Mb
8
8
8
-
-
-
-
7.8
3.9
75
M470T2864QZ(H)3
Min
-
-
-
512Mb
105
7.8
3.9
3.75
min
15
15
60
45
5
3
-
DDR2-667(E6)
Max
32
34
9
5 - 5 - 5
127.5
1Gb
7.8
3.9
(V
M470T6464QZ(H)3
DD
Min
DDR2 SDRAM
70000
max
=1.8V, V
Rev. 1.1 July 2008
-
-
-
8
8
8
-
-
-
-
2Gb
195
7.8
3.9
DDQ
Max
5.5
327.5
24
34
4Gb
=1.8V, TA=25
7.8
3.9
Units
ns
ns
ns
ns
ns
ns
ns
ns
Units
Units
pF
ns
µs
µs
o
C)

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