MACH445-12 Lattice, MACH445-12 Datasheet - Page 9

• Manufacturer Part Number: MACH445-12
• Description: High-Density EE CMOS Programmable Logic
• Manufacturer: Lattice

ABSOLUTE MAXIMUM RATINGS
Storage Temperature
Ambient Temperature
with Power Applied
Supply Voltage with
Respect to Ground
DC Input Voltage
DC Output or
I/O Pin Voltage
Static Discharge Voltage
Latchup Current
(T
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
CAPACITANCE (Note 6)
Notes:
1. Total I
2. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
3. I/O pin leakage is the worst case of I
4. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
5. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and capable of being loaded,
6. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified
Parameter
Parameter
Symbol
A
Symbol
V
enabled, and reset.
where capacitance may be affected.
= 0 C to +70 C)
C
OUT
C
V
I
V
I
OUT
V
V
I
I
OZH
OZL
I
I
IN
SC
CC
OH
IH
OL
IL
IH
IL
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
OL
for one PAL block should not exceed 128 mA.
Parameter Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input HIGH Leakage Current
Input LOW Leakage Current
Off-State Output Leakage
Current HIGH
Off-State Output Leakage
Current LOW
Output Short-Circuit Current
Supply Current
Parameter Description
Input Capacitance
Output Capacitance
. . . . . . . . . . . . .
. . . . . . . . . . . .
. . . . . . . . . . . . .
. . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . .
. . . . . . . . . . . . . . . . .
–0.5 V to V
–0.5 V to V
IL
–65 C to +150 C
–55 C to +125 C
–0.5 V to +7.0 V
and I
OZL
CC
CC
(or I
MACH445-12 (Com’l)
200 mA
2001 V
+0.5 V
+0.5 V
IH
Test Conditions
I
V
I
V
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 2)
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 2)
V
V
V
V
V
V
V
V
V
Test Conditions
V
V
OH
OL
and I
IN
IN
IN
IN
OUT
IN
OUT
IN
OUT
IN
CC
IN
OUT
= 24 mA, V
= 0 V, Outputs Open (I
= 2.0 V
= V
= 5.25 V, V
= 0 V, V
= V
= V
= –3.2 mA, V
= V
= 5.0 V, f =25 MHz, T
= 2.0 V
= 5.25 V, V
= 0 V, V
= 0.5 V, V
OZH
IH
IH
IH
IH
or V
or V
or V
or V
).
OPERATING RANGES
Commercial (C) Devices
Temperature (T
in Free Air
Supply Voltage (V
Respect to Ground
Operating ranges define those limits between which the
functionality of the device is guaranteed.
Stresses above those listed under Absolute Maximum
Ratings may cause permanent device failure. Functionality at
or above these limits is not implied. Exposure to Absolute
Maximum Ratings for extended periods may affect device
reliability. Programming conditions may differ.
CC
IL
IL
IL
CC
IL
CC
= Max (Note 3)
CC
(Note 1)
(Note 3)
(Note 3)
CC
= Max
V
f = 1 MHz
CC
CC
= Min
= Max (Note 3)
CC
= Max (Note 4)
= Max
= Min
= 5.0 V, T
. . . . . . . . . . . . . . . . . . . . . . .
A
OUT
= 25 C (Note 5)
A
= 0 mA)
) Operating
A
CC
= 25 C,
. . . . . . . . . . . .
) with
Min
–30
2.4
2.0
+4.75 V to +5.25 V
Typ
255
Typ
6
8
0 C to +70 C
–100
–160
–100
Max
0.5
0.8
10
10
Unit
pF
pF
Unit
mA
mA
V
V
V
V
A
A
A
A
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