SAF7113H/V1,557 NXP Semiconductors, SAF7113H/V1,557 Datasheet - Page 67

• Manufacturer Part Number: SAF7113H/V1,557
• Description: IC VIDEO INPUT PROCESSOR 44-QFP
• Manufacturer: NXP Semiconductors
• Type: Video Processorr

Specifications of SAF7113H/V1,557

• Package / Case: 44-MQFP, 44-PQFP
• Applications: AGP Cards, PCMCIA, Video Phones
• Mounting Type: Surface Mount
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 568-1319; 935263595557; SAF7113HB

Philips Semiconductors
16. Test information
9397 750 14231
Product data sheet
16.1 Boundary scan test
The SAF7113H has built-in logic and five dedicated pins to support boundary scan testing
which allows board testing without special hardware (nails). The SAF7113H follows the
“IEEE Std. 1149.1 - Standard Test Access Port and Boundary-Scan Architecture” set by
the Joint Test Action Group (JTAG) chaired by Philips.
The 5 special pins are Test Mode Select (TMS), Test Clock (TCK), Test Reset (TRST),
Test Data Input (TDI) and Test Data Output (TDO).
The Boundary Scan Test (BST) functions BYPASS, EXTEST, INTEST, SAMPLE, CLAMP
and IDCODE are all supported (see
found in the specification “ IEEE Std. 1149.1” . A file containing the detailed Boundary Scan
Description Language (BSDL) of the SAF7113H is available on request.
Table 80:
Instruction
BYPASS
EXTEST
SAMPLE
CLAMP
IDCODE
INTEST
USER1
Fig 41. Oscillator application
a. With quartz crystal
Order number: Philips 4322 143 05291
quartz (3rd harmonic)
24.576 MHz
C =
10 pF
C =
10 pF
BST instructions supported by the SAF7113H
Description
This mandatory instruction provides a minimum length serial path (1 bit) between
pins TDI and TDO when no test operation of the component is required.
This mandatory instruction allows testing of off-chip circuitry and board level
interconnections.
This mandatory instruction can be used to take a sample of the inputs during
normal operation of the component. It can also be used to preload data values into
the latched outputs of the boundary scan register.
This optional instruction is useful for testing when not all ICs have BST. This
instruction addresses the bypass register while the boundary scan register is in
external test mode.
This optional instruction will provide information on the components manufacturer,
part number and version number.
This optional instruction allows testing of the internal logic (no support for
customers available).
This private instruction allows testing by the manufacturer (no support for
customers available).
L = 10 H ± 20 %
C =
1 nF
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Table
80). Details about the JTAG BST-test can be
b. With external clock
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
9-bit video input processor
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