DS21552L+ Maxim Integrated Products, DS21552L+ Datasheet - Page 103

• Manufacturer Part Number: DS21552L+
• Description: IC TXRX T1 1-CHIP 5V 100-LQFP
• Manufacturer: Maxim Integrated Products

Specifications of DS21552L+

• Function: Single-Chip Transceiver
• Interface: E1, HDLC, J1, T1
• Number Of Circuits: 1
• Voltage - Supply: 4.75 V ~ 5.25 V
• Current - Supply: 75mA
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Package / Case: 100-LQFP
• Includes: DSX-1 and CSU Line Build-Out Generator, HDLC Controller, In-Band Loop Code Generator and Detector
• Product: Framer
• Number Of Transceivers: 1
• Data Rate: 64 Kbps
• Supply Voltage (max): 3.465 V
• Supply Voltage (min): 3.135 V
• Supply Current (max): 75 mA (Typ)
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• Mounting Style: SMD/SMT
• Ic Interface Type: Parallel, Serial
• Supply Voltage Range: 4.75V To 5.25V
• Operating Temperature Range: 0°C To +70°C
• Digital Ic Case Style: LQFP
• No. Of Pins: 100
• Filter Terminals: SMD
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Power (watts): -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

IDCODE
When the IDCODE instruction is latched into the parallel instruction register, the identification test
register is selected. The device identification code will be loaded into the identification register on the
rising edge of JTCLK following entry into the Capture-DR state. Shift-DR can be used to shift the
identification code out serially via JTDO. During Test-Logic-Reset, the identification code is forced into
the instruction register’s parallel output. The ID code will always have a ‘1’ in the LSB position. The
next 11 bits identify the manufacturer’s JEDEC number and number of continuation bytes followed by 16
bits for the device and 4 bits for the version. See Table 19-2. Table 19-3 lists the device ID codes for the
SCT devices.
Table 19-2 ID CODE STRUCTURE
MSB
Version
Contact Factory
4 bits
Table 19-3 DEVICE ID CODES
19.4 TEST REGISTERS
IEEE 1149.1 requires a minimum of two test registers; the bypass register and the boundary scan register.
An optional test register has been included with the DS21352/552 design. This test register is the
identification register and is used in conjunction with the IDCODE instruction and the Test-Logic-Reset
state of the TAP controller.
BOUNDARY SCAN REGISTER
This register contains both a shift register path and a latched parallel output for all control cells and
digital I/O cells and is n bits in length. See Table 19-4 for all of the cell bit locations and definitions.
BYPASS REGISTER
This is a single one-bit shift register used in conjunction with the BYPASS, CLAMP, and HIGHZ
instructions which provides a short path between JTDI and JTDO.
DEVICE
DS21354
DS21554
DS21352
DS21552
Device ID
16bits
JEDEC
00010100001
103 of 137
16-BIT ID
0005h
0003h
0004h
0002h
LSB
1
1
DS21352/DS21552