LQ230M1LW11 Sharp Electronics, LQ230M1LW11 Datasheet - Page 29

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LQ230M1LW11

Manufacturer Part Number
LQ230M1LW11
Description
Manufacturer
Sharp Electronics
Datasheet

Specifications of LQ230M1LW11

Lead Free Status / Rohs Status
Compliant
15. Reliability test items
No
【 Result evaluation criteria】
1
2
3
4
5
6
7
8
Under the display quality test conditions with normal operation state, these shall be no change which may affect
practical display function.
High temperature storage test
Test item
Low temperature storage test
High temperature
& high humidity operation test
High temperature operation test
Low temperature operation test
Vibration test
(non- operating)
Shock test
(non- operating)
Thermal shock test
(non- operating )
Waveform : Sine wave
Frequency : 10∼57Hz/Vibration width (one side) : 0.075mm
Sweep time : 11minutes
Test period : 3 hours
Max. gravity : 490m/s
Pulse width : 11ms, sine wave
Direction : ±X, ±Y, ±Z,
Ta=-25℃∼60℃ ; 5 cycles
Test period : 10 hours (1 hour for each temperature)
Conditions
Ta = 60℃
Ta = -25℃
Ta = 40℃ ; 95%RH 240h
(No condensation)
Ta = 50℃
(The panel temp. must be less than 60℃)
Ta = 0℃
* If The panel temp 65℃ MAX, 48h
once for each direction.
: 57∼500Hz/Gravity : 9.8m/s
(1 hour for each direction of X,Y,Z)
240h
240h
240h
240H
2
2

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