CYNCP80192-BGC Cypress Semiconductor Corp, CYNCP80192-BGC Datasheet - Page 26

• Manufacturer Part Number: CYNCP80192-BGC
• Manufacturer: Cypress Semiconductor Corp

Specifications of CYNCP80192-BGC

• Lead Free Status / Rohs Status: Not Compliant

15.0
The CYNPC80192 supports the Test Access Port and
Boundary Scan Architecture as specified in the IEEE JTAG
Standard 1149.1. The pin interface to the chip consists of five
signals with the standard definitions: TCK, TMS, TDI, TDO,
and TRST_L. Table 15-1 and Table 15-2 describe the
operations that the test access port controller supports and the
test access port device ID register.
Table 15-1. Test Access Port Controller Instructions
Table 15-2. Test Access Port Device ID Register
16.0
This
capacitance, operating conditions, DC characteristics, and AC
timing parameters for the NDC (see Table 16-1, Table 16-2,
Table 16-3, Table 16-4, and Table 16-5).
Table 16-1. Electrical Characteristics
Table 16-2. Capacitance
Document #: 38-02043 Rev. *C
I
I
V
V
I
I
C
C
Notes:
Instruction
10. Average operating current at maximum frequency. Transient peak currents may exceed these values.
12. f = 1 MHz, V
Part Number [27:12] 0000 0000 0000 0011 This is the part number for this device.
11. f = 1 MHz, V
LI
LO
CC
CC
PRELOAD
9.
SAMPLE/
OL
OH
IN
OUT
EXTEST
INTEST
Revision
Parameter
_core
_IO
Field
MFID
Applies only for outputs in three-state.
LSB
section
Parameter
JTAG (1149.1) Testing
Electrical Characteristics
Mandatory Sample/Preload. Loads the values of signals going to and from I/O pins into the boundary scan shift
Mandatory External Test. Uses boundary scan values shifted in from TAP to test connectivity external to the device.
IN
OUT
Optional Internal Test. Allows slow-speed functional testing of the device using the boundary scan register to
Range
[31:28]
= 0V.
[11:1]
Type
describes
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
2.5 V Supply Current
3.3 V Supply Current
– 0V.
0
register to provide a snapshot of the normal functional operation.
provide the I/O values.
000_1101_1100
Input Capacitance
Output Capacitance
the
Initial Value
Description
0001
1
electrical
[10]
[9]
specifications,
Revision Number. This is the current device revision number. Numbers start
from one and increment by one for each revision of the device.
Manufacturer ID. This field is the same as the manufacturer ID used in the TAP
controller.
Least Significant Bit.
Description
0 < V
0 < V
8 mA, V
4 mA, V
IN
OUT
Test Conditions
< V
DDQ
DDQ
< V
DDQ
Description
= 3.3V
= 3.3V
DDQ
Description
Min.
–10
–10
2.4
Max.
TBD
TBD
Max.
TBD
TBD
0.4
10
10
CYNCP80192
Page 26 of 37
pF
pF
Unit
[12]
[11]
Unit
mA
mA
uA
uA
V
V