MT4HTF3264HY-667F1 Micron Technology Inc, MT4HTF3264HY-667F1 Datasheet - Page 11

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MT4HTF3264HY-667F1

Manufacturer Part Number
MT4HTF3264HY-667F1
Description
Manufacturer
Micron Technology Inc
Datasheet

Specifications of MT4HTF3264HY-667F1

Main Category
DRAM Module
Sub-category
DDR2 SDRAM
Module Type
200SODIMM
Device Core Size
64b
Organization
32Mx64
Total Density
256MByte
Chip Density
512Mb
Maximum Clock Rate
667MHz
Operating Supply Voltage (typ)
1.8V
Operating Current
1A
Number Of Elements
4
Operating Supply Voltage (max)
1.9V
Operating Supply Voltage (min)
1.7V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Pin Count
200
Mounting
Socket
Lead Free Status / RoHS Status
Compliant
Table 11: DDR2 I
Values shown for MT47H32M16 DDR2 SDRAM only and are computed from values specified in the 512Mb (32 Meg x 16)
component data sheet
PDF: 09005aef8161d160
htf4c16_32_64x64h.pdf - Rev. I 3/10 EN
Parameter
Operating one bank active-precharge current:
t
commands; Address bus inputs are switching; Data bus inputs are switching
Operating one bank active-read-precharge current: I
4, CL = CL (I
(I
Address bus inputs are switching; Data pattern is same as I
Precharge power-down current: All device banks idle;
CKE is LOW; Other control and address bus inputs are stable; Data bus in-
puts are floating
Precharge quiet standby current: All device banks idle;
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
Precharge standby current: All device banks idle;
HIGH, S# is HIGH; Other control and address bus inputs are switching; Da-
ta bus inputs are switching
Active power-down current: All device banks open;
=
puts are stable; Data bus inputs are floating
Active standby current: All device banks open;
t
mands; Other control and address bus inputs are switching; Data bus
inputs are switching
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (I
(I
Address bus inputs are switching; Data bus inputs are switching
Operating burst read current: All device banks open; Continuous burst
read, I
MAX (I
mands; Address bus inputs are switching; Data bus inputs are switching
Burst refresh current:
(I
trol and address bus inputs are switching; Data bus inputs are switching
Self refresh current: CK and CK# at 0V; CKE ≤ 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
RC (I
RAS MAX (I
DD
DD
DD
t
CK (I
),
),
) interval; CKE is HIGH, S# is HIGH between valid commands; Other con-
DD
t
t
RCD =
RP =
OUT
DD
DD
),
),
t
); CKE is LOW; Other control and address bus in-
RAS =
= 0mA; BL = 4, CL = CL (I
t
t
DD
RP (I
RP =
DD
t
RCD (I
), AL = 0;
),
t
DD
t
t
RP =
RAS MIN (I
RP (I
); CKE is HIGH, S# is HIGH between valid commands;
DD
DD
DD
); CKE is HIGH, S# is HIGH between valid commands;
t
RP (I
Specifications and Conditions – 256MB
t
CK =
t
); CKE is HIGH, S# is HIGH between valid com-
CK =
DD
DD
t
); CKE is HIGH, S# is HIGH between valid com-
DD
CK (I
t
); CKE is HIGH, S# is HIGH between valid
CK (I
), AL = 0;
DD
DD
DD
),
), AL = 0;
); REFRESH command at every
t
RC =
128MB, 256MB, 512MB (x64, SR) 200-Pin DDR2 SODIMM
t
CK =
t
RC (I
t
CK =
t
CK (I
DD
t
CK =
t
CK =
),
t
t
DD
CK (I
CK =
t
RAS =
),
t
CK
t
CK (I
t
t
RAS =
DD
CK (I
t
OUT
CK =
t
DD4W
t
CK (I
CK =
),
11
Fast PDN exit
MR[12] = 0
Slow PDN exit
MR[12] = 1
t
DD
RAS MIN
t
= 0mA; BL =
DD
RAS =
),
t
DD
t
CK (I
RAS MAX
),
t
t
CK (I
); CKE is
RAS =
t
RC =
t
RFC
t
DD
RAS
DD
Micron Technology, Inc. reserves the right to change products or specifications without notice.
);
);
Symbol
I
I
I
I
I
I
I
DD4W
I
I
DD2Q
DD2N
DD3N
I
I
DD2P
DD3P
DD4R
DD0
DD1
DD5
DD6
-80E/-
1180
1100
800
540
660
260
280
160
300
920
28
48
28
1000
-667
480
600
260
280
140
280
940
740
© 2005 Micron Technology, Inc. All rights reserved.
28
48
28
I
DD
-53E
Specifications
440
540
220
240
120
240
820
780
700
28
48
28
-40E
440
520
180
200
100
200
640
620
680
28
48
28
Units
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA

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