5962-9098903MLA E2V, 5962-9098903MLA Datasheet - Page 5

• Manufacturer Part Number: 5962-9098903MLA
• Manufacturer: E2V

Specifications of 5962-9098903MLA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
prior to delivery.
specified in 4.6.
and characteristics specified in 4.7.
specified pattern or erased. As a minimum, verification shall consist of performing a functional test (subgroup 7) to verify that all bits
are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure, and shall be removed
from the lot.
wide variety of configurations; two processing options are provided for selection in the contract.
table IIA. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program configuration.
including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to delivery.
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
microcircuit group number 42 (see MIL-PRF-38535, appendix A).
test shall be done only for initial characterization and after any design or process changes which may affect the reprogrammability of
the device. The methods and procedures may be vendor specific, but will guarantee the number of program/erase endurance cycles
listed in section 1.3 herein. The vendors procedure shall be under document control and shall be made available upon request.
be done for initial characterization and after any design or process change which may affect data retention. The methods and
procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military
temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of
the acquiring or preparing activity, along with test data.
3.8 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
3.9 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
3.10 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
3.11 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain
3.14 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall
3.12 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
3.6 Processing EPLDS. All testing requirements and quality assurance provisions herein shall be satisfied by the manufacturer
3.6.1 Erasure of EPLDS. When specified, devices shall be erased in accordance with the procedures and characteristics
3.6.2 Programmability of EPLDS. When specified, devices shall be programmed to the specified pattern using the procedures
3.6.3 Verification of erasure or programmed EPLDS. When specified, devices shall be verified as either programmed to the
3.7 Processing options. Since the device is capable of being programmed by either the manufacturer or the user to result in a
3.7.1 Unprogrammed device delivered to the user. All testing shall be verified through group A testing as defined in 3.2.3.1 and
3.7.2 Manufacturer programmed device delivered to the user. All testing requirements and quality assurance provisions herein,
3.13 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitor. This reprogrammability
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
A
SHEET
5962-90989
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