5962-87650033A E2V, 5962-87650033A Datasheet - Page 4

• Manufacturer Part Number: 5962-87650033A
• Manufacturer: E2V

Specifications of 5962-87650033A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
as specified in table I and shall apply over the full case operating temperature range.
tests for each subgroup are described in table I.
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For
packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the
option of not marking the "5962-" on the device.
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
manufacturer prior to delivery.
specified in 4.4.
procedures and characteristics specified in 4.5.
programmed to the specified pattern or erased. As a minimum, verification shall consist of performing a functional test
(subgroups 7 and 8) to verify that all bits are in proper state. Any bit that does not verify to be in the proper state shall
constitute a device failure and shall be removed from the lot.
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-
38535, appendix A and the requirements herein.
with each lot of microcircuits delivered to this drawing.
appendix A.
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
shall be done for initial characterization and after any design or process change which may affect data retention. The methods
and procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full
military temperature range. The vendor's procedure shall be kept under document control and shall be made available upon
request of the acquiring or preparing activity, along with test data.
done for initial characterization and after any design or process change which may affect the reprogrammability of the device.
The methods and procedures may be vendor specific, but shall guarantee the number of program/erase endurance cycles
listed in section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept under document
control and shall be made available upon request of the acquiring or preparing activity, along with test data.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
3.6 Processing EPROMS. All testing requirements and quality assurance provisions herein shall be satisfied by the
3.6.1 Erasure of EPROMS. When specified, devices shall be erased in accordance with the procedures and characteristics
3.6.2 Programmability of EPROMS. When specified, devices shall be programmed to the specified pattern using the
3.6.3 Verification of erasure or programmability of EPROMS. When specified, devices shall be verified as either
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
3.9 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535,
3.10 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
3.11 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test
3.12 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This test shall be
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
STANDARD
SIZE
A
REVISION LEVEL
E
SHEET
5962-87650
4