5962-87650033A E2V, 5962-87650033A Datasheet - Page 10

• Manufacturer Part Number: 5962-87650033A
• Manufacturer: E2V

Specifications of 5962-87650033A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
made available upon request.
appendix A.
prior to quality conformance inspection. The following additional criteria shall apply:
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
253.7 nm. The recommended integrated dose (i.e., UV intensity X exposure time) is 15 W-s/cm
source which can erase the device in 30 minutes is the model S52 shortwave ultraviolet lamp. The lamp should be used
without short wave filters and the EPROM should be placed about one inch from the lamp tubes. After erasure, all bits are in
the high state.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
4.4 Erasing procedure. The device is erased by exposure to high intensity shortwave ultraviolet light at a wavelength of
4.5 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be
a. Burn-in test, method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
c. A data retention stress test shall be included as part of the screening procedure. Margin test methods shall be
a.
b.
c.
d.
a.
b.
(1)
(2)
tests prior to burn-in are optional at the discretion of the manufacturer.
maintained by the manufacturer under document revision level control and shall be made available to the preparing or
acquiring activity upon request.
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input capacitance. A minimum sample of five (5) devices with zero failures shall be
required.
All devices selected for testing shall be programmed with a checkerboard pattern or equivalent. After completion of
all testing, the devices shall be erased and verified (except devices submitted for groups C and D testing).
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
T
A
MICROCIRCUIT DRAWING
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1005 of MIL-STD-883.
T
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43216-5000
= +125 C, minimum.
A
= +125 C, minimum.
STANDARD
IN
and C
OUT
measurements) shall be measured only for the initial test and after process or design
SIZE
A
REVISION LEVEL
E
2
. An example of an ultraviolet
SHEET
5962-87650
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