MRF8S9170NR3 Freescale Semiconductor, MRF8S9170NR3 Datasheet - Page 2

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MRF8S9170NR3

Manufacturer Part Number
MRF8S9170NR3
Description
FET RF N-CH 900MHZ 28V OM780-2
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MRF8S9170NR3

Transistor Type
N-Channel
Frequency
920MHz
Gain
19.3dB
Voltage - Rated
70V
Current - Test
1A
Voltage - Test
28V
Power - Output
50W
Package / Case
OM-780-2
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Current Rating
-
Noise Figure
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MRF8S9170NR3
Manufacturer:
NVIDIA
Quantity:
1 560
2
MRF8S9170NR3
Table 3. ESD Protection Characteristics
Table 4. Moisture Sensitivity Level
Table 5. Electrical Characteristics
Off Characteristics
On Characteristics
Functional Tests
Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz
Channel Bandwidth @ ±5 MHz Offset.
Typical Broadband Performance (In Freescale Test Fixture, 50 ohm system) V
Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz
Channel Bandwidth @ ±5 MHz Offset.
Human Body Model (per JESD22--A114)
Machine Model (per EIA/JESD22--A115)
Charge Device Model (per JESD22--C101)
Per JESD22--A113, IPC/JEDEC J--STD--020
Zero Gate Voltage Drain Leakage Current
Zero Gate Voltage Drain Leakage Current
Gate--Source Leakage Current
Gate Threshold Voltage
Gate Quiescent Voltage
Drain--Source On--Voltage
Power Gain
Drain Efficiency
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF
Adjacent Channel Power Ratio
Input Return Loss
1. Part internally matched both on input and output.
(V
(V
(V
(V
(V
(V
DS
DS
GS
DS
DD
GS
= 70 Vdc, V
= 28 Vdc, V
= 5 Vdc, V
= 10 Vdc, I
= 28 Vdc, I
= 10 Vdc, I
(1)
DS
D
D
D
(In Freescale Test Fixture, 50 ohm system) V
GS
GS
= 355 μAdc)
= 1000 mAdc, Measured in Functional Test)
= 2.9 Adc)
= 0 Vdc)
= 0 Vdc)
= 0 Vdc)
Test Methodology
Characteristic
Frequency
920 MHz
940 MHz
960 MHz
Test Methodology
(T
A
= 25°C unless otherwise noted)
DD
= 28 Vdc, I
(dB)
19.3
19.1
18.9
Symbol
G
V
Rating
V
V
ACPR
DD
I
I
I
DQ
PAR
ps
DS(on)
GS(th)
GS(Q)
G
IRL
DSS
DSS
GSS
η
3
ps
D
= 28 Vdc, I
= 1000 mA, P
36.5
36.1
36.0
(%)
η
18.0
34.0
D
Min
DQ
Package Peak Temperature
1.5
2.3
0.1
5.5
out
= 1000 mA, P
= 50 W Avg., f = 920 MHz,
Output PAR
(dB)
--36.6
6.0
6.1
6.0
0.19
19.3
36.5
260
Typ
--10
2.3
3.1
6.0
IV (Minimum)
A (Minimum)
2 (Minimum)
out
Class
Freescale Semiconductor
= 50 W Avg.,
ACPR
--34.5
(dBc)
--36.6
--36.7
--36.1
Max
21.0
3.8
0.3
10
--7
1
1
3
RF Device Data
(continued)
μAdc
μAdc
μAdc
Unit
Unit
(dB)
Vdc
Vdc
Vdc
dBc
IRL
--10
--12
--16
dB
dB
dB
°C
%

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