ADF7025BCPZ Analog Devices Inc, ADF7025BCPZ Datasheet - Page 39

IC ASK/FSK TXRX 928MHZ 48-LFCSP

ADF7025BCPZ

Manufacturer Part Number
ADF7025BCPZ
Description
IC ASK/FSK TXRX 928MHZ 48-LFCSP
Manufacturer
Analog Devices Inc
Datasheet

Specifications of ADF7025BCPZ

Frequency
431MHz ~ 464MHz, 862MHz ~ 870MHz and 902MHz ~ 928MHz
Data Rate - Maximum
384kbps
Modulation Or Protocol
FSK
Applications
Keyless Entery, Home Automation, Wireless Audio/Video
Power - Output
-20dBm ~ 13dBm
Sensitivity
-104dBm
Voltage - Supply
2.3 V ~ 3.6 V
Current - Receiving
19mA
Current - Transmitting
28mA
Data Interface
PCB, Surface Mount
Antenna Connector
PCB, Surface Mount
Operating Temperature
-40°C ~ 85°C
Package / Case
48-LFCSP
Receiving Current
21mA
Transmitting Current
19.3mA
Data Rate
384Kbps
Frequency Range
431MHz To 928MHz
Modulation Type
FSK
Rf Ic Case Style
LFCSP
No. Of Pins
48
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
EVAL-ADF70XXEKZ1 - KIT DEV ADF702X FOR BF533EZKITEVAL-ADF7025DBZ1 - BOARD EVAL ADF7025 902-928MHZ
Memory Size
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ADF7025BCPZ-RL
Manufacturer:
ADI/亚德诺
Quantity:
20 000
REGISTER 12—TEST REGISTER
Using the Test DAC on the ADF7025 to Implement
Analog FM DEMOD and Measuring SNR
The test DAC allows the output of the postdemodulator filter
for both the linear and correlator/demodulators to be viewed
externally. It takes the 16-bit filter output and converts it to a
high frequency, single-bit output using a second-order error
feedback Σ-Δ converter. The output can be viewed on the
XCLK
then be used to
• Monitor the signals at the FSK postdemodulator filter
• Provide analog FM demodulation.
While the correlators and filters are clocked by DEMOD_CLK,
CDR_CLK clocks the test DAC. Note that, although the test
DAC functions in a regular user mode, the best performance is
achieved when the CDR_CLK is increased up to or above the
frequency of DEMOD_CLK. The CDR block does not function
when this condition exists.
output. This allows the demodulator output SNR to be
measured. Eye diagrams can also be constructed of the
received bit stream to measure the received signal quality.
OUT
P
0
1
pin. This signal, when IF-filtered appropriately, can
PRESCALER
4/5 (DEFAULT)
8/9
ANALOG TEST
MUX
CS1
0
1
CAL SOURCE
INTERNAL
SERIAL IF BW CAL
IMAGE FILTER ADJUST
DEFAULT = 32. INCREASE
NUMBER TO INCREASE BW
IF USER CAL ON
Figure 50. Register 12—Test Register
Rev. A | Page 39 of 44
TEST MODES
DIGITAL
Programming the test register, Register 12, enables the test
DAC. Both the linear and correlator/demodulator outputs
can be multiplexed into the DAC.
Register 13 allows a fixed offset term to be removed from the
signal in the case where there is an error in the received signal
frequency. If there is a frequency error in the signal, the user
should program half this value into the offset removal field.
It also has a signal gain term to allow usage of the maximum
dynamic range of the DAC.
Setting Up the Test DAC
The output of the active demodulator drives the DAC; that is, if
the FSK correlator/demodulator is selected, the correlator filter
output drives the DAC.
CR1
0
1
Digital test modes = 7: enables the test DAC, with no
Digital test modes = 10: enables the test DAC, with
offset removal.
offset removal (0x0001C00C).
COUNTER RESET
DEFAULT
RESET
TEST MODES
Σ-∆
PLL TEST MODES
ADDRESS
BITS
ADF7025

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