EVAL-ADUC7032QSPZ Analog Devices Inc, EVAL-ADUC7032QSPZ Datasheet - Page 110
![EVAL DEV QUICK START ADUC7032](/photos/9/24/92482/eval-aduc7032qspz_sml.jpg)
EVAL-ADUC7032QSPZ
Manufacturer Part Number
EVAL-ADUC7032QSPZ
Description
EVAL DEV QUICK START ADUC7032
Manufacturer
Analog Devices Inc
Series
QuickStart™ PLUS Kitr
Type
MCUr
Datasheet
1.EVAL-ADUC7032QSPZ.pdf
(116 pages)
Specifications of EVAL-ADUC7032QSPZ
Contents
Evaluation Board, Power Supply, Cable, Software, Emulator and Documentation
For Use With/related Products
ADuC7032
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
- Current page: 110 of 116
- Download datasheet (3Mb)
ADuC7032-8L
ADuC7032-8L ON-CHIP DIAGNOSTICS
The ADuC7032-8L integrates multiple diagnostic support
circuits on-chip. These circuits allow the device to test core
digital functionality, and analog front-end and high voltage I/O
ports in-circuit.
ADC DIAGNOSTICS
Internal Test Voltage
The current channel can be configured to convert on an
internal 8.3 mV test voltage. On any gain range, the result
should be within ±2% of the expected result.
Internal Short Mode
The current and voltage input channels can also be shorted
internally. Converting on the internal short allows an
assessment of the internal ADC noise.
Rev.0 | Page 110 of 116
Internal Current Sources
Internal current sources can also be enabled on both current
and temperature channels. These current sources can be used
to determine external short-circuit or open-circuit conditions
in both external shunt or temperature sensor configurations.
HIGH VOLTAGE I/O DIAGNOSTICS
High Voltage I/O Readback
All high voltage I/O pins are supported with readback capa-
bility, which allows the detection of external short conditions.
High Voltage Current Detection
All high voltage I/O pins also have a high current detection
capability, allowing high-side connections to VBAT to be
detected and controlled.
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