EVAL-AD5664REBZ Analog Devices Inc, EVAL-AD5664REBZ Datasheet - Page 18

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EVAL-AD5664REBZ

Manufacturer Part Number
EVAL-AD5664REBZ
Description
BOARD EVALUATION FOR AD5664R
Manufacturer
Analog Devices Inc
Series
nanoDAC™r
Datasheet

Specifications of EVAL-AD5664REBZ

Number Of Dac's
4
Number Of Bits
16
Outputs And Type
4, Single Ended
Sampling Rate (per Second)
220k
Data Interface
Serial
Settling Time
4µs
Dac Type
Voltage
Voltage Supply Source
Single
Operating Temperature
-40°C ~ 105°C
Utilized Ic / Part
AD5664R
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD5624R/AD5644R/AD5664R
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSBs, from a
straight line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot can be seen in Figure 4.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot can be seen in Figure 7.
Zero-Code Error
Zero-scale error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5664R because the output of the DAC cannot go below
0 V due to a combination of the offset errors in the DAC and
the output amplifier. Zero-code error is expressed in mV. A plot
of zero-code error vs. temperature can be seen in Figure 26.
Full-Scale Error
Full-scale error is a measurement of the output error when full-
scale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be V
percent of full-scale range. A plot of full-scale error vs.
temperature can be seen in Figure 25.
Gain Error
This is a measure of the span error of the DAC. It is the deviation
in slope of the DAC transfer characteristic from the ideal
expressed as % of FSR.
Zero-Code Error Drift
This is a measurement of the change in zero-code error with a
change in temperature. It is expressed in μV/°C.
Gain Temperature Coefficient
This is a measurement of the change in gain error with changes
in temperature. It is expressed in ppm of FSR/°C.
Offset Error
Offset error is a measure of the difference between V
and V
transfer function. Offset error is measured on the AD5664R
with code 512 loaded in the DAC register. It can be negative or
positive.
DC Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in V
a change in V
in dB. V
OUT
REF
(ideal) expressed in mV in the linear region of the
is held at 2 V, and V
DD
for full-scale output of the DAC. It is measured
DD
− 1 LSB. Full-scale error is expressed in
DD
is varied by ±10%.
OUT
(actual)
OUT
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Output Voltage Settling Time
This is the amount of time it takes for the output of a DAC to
settle to a specified level for a ¼ to ¾ full-scale input change
and is measured from the 24
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s,
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000) (see
Figure 40).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s, and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated. It is expressed in dB.
Noise Spectral Density
This is a measurement of the internally generated random
noise. Random noise is characterized as a spectral density
(nV/√Hz). It is measured by loading the DAC to midscale and
measuring noise at the output. It is measured in nV/√Hz. A plot
of noise spectral density can be seen in Figure 46.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC kept
at midscale. It is expressed in μV.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has to
another DAC kept at midscale. It is expressed in μV/mA.
Digital Crosstalk
This is the glitch impulse transferred to the output of one DAC
at midscale in response to a full-scale code change (all 0s to all
1s and vice versa) in the input register of another DAC. It is
measured in standalone mode and is expressed in nV-s.
th
falling edge of SCLK.

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