MAX11801TEVS+ Maxim Integrated Products, MAX11801TEVS+ Datasheet - Page 6
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MAX11801TEVS+
Manufacturer Part Number
MAX11801TEVS+
Description
KIT EVAL TOUCH SCREEN
Manufacturer
Maxim Integrated Products
Datasheet
1.MAX11803EWCT.pdf
(59 pages)
Specifications of MAX11801TEVS+
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Low-Power, Ultra-Small Resistive Touch-Screen
Controllers with I
Table 1. Terminology
6
Touch Screen,
Touch Panel
_______________________________________________________________________________________
R
Panel,
TERM
TOUCH
DCM
ACM
PMC
CMC
ADC
AVG
MAF
TDM
TSC
AUX
SAF
PSU
X+
Y+
AP
Z1
Z2
X-
Y-
Resistive Touch Sensor: Panel, or touch screen, or touch panel are used interchangeably to denote the
resistive touch sensor.
Touch-Screen Controller: Devices attached to a touch screen that provide the interface between an
application processor (AP) and touch screen.
X Position Positive I/O: Analog I/O from resistive touch screen. See Figure 4 for configuration and
measurement details.
X Position Negative I/O: Analog I/O from resistive touch screen. See Figure 4 for configuration and
measurement details.
Y Position Positive I/O: Analog I/O from resistive touch screen. See Figure 4 for configuration and measurement
details.
Y Position Negative I/O: Analog I/O from resistive touch screen. See Figure 4 for configuration and
measurement details.
Touch Resistance: Represents the resistance between the X and Y planes of a resistive touch screen during a
touch event.
Z1 Measurement: A resistive touch-screen measurement to determine the resistance between the two planes
within the panel sensor during a touch event (R
Z2 Measurement: A resistive touch-screen measurement to determine the resistance between the two planes
within the panel sensor during a touch event (R
Auxiliary Input: Analog input to the MAX11800–MAX11803 that can be used to monitor external conditions
such as battery voltage or temperature.
Analog-to-Digital Converter: Circuit used to transform analog information into a form suitable for digital operations.
Application Processor: An external microcontroller or microprocessor that interfaces to and controls the
general operation of the MAX11800–MAX11803.
Averaging Mode: The ability to average consecutive measurement results to reduce noise from switch
bounce, power-supply ripple, and incomplete settling.
Median Averaging Filter: The MAF first removes the minimum and maximum samples before taking the
average of the remaining sample set.
Straight Averaging Filter: The SAF takes the average of an entire sample set.
Touch-Detect Mode: An untimed mode that monitors the panel for a touch using a user-selectable panel
pullup resistor of either 50k
Direct Conversion Mode: A mode of operation in which the AP requests individual panel setup and
conversion operations or automated combinations of measurements (X and Y, X and Y and Z1, or X and Y and
Z1 and Z2). The AP maintains control over the initiation of panel setup, measurements, and the sampling
f
Autonomous Conversion Mode: A mode of operation in which the MAX11800/MAX11801 idle in TDM until a
touch event occurs. After a touch is detected, the MAX11800/MAX11801 begin an automated sequence of
measurements determined by the user configuration registers.
Panel Setup Command: User-programmable modes for the purpose of allowing the panel sufficient time to
settle, prior to the start of measurements. PSU commands configure the on-chip multiplexer in preparation to
perform either X, Y, Z1, or Z2 measurements. Durations can either be specified and managed by the
MAX11800–MAX11803 (in ACM and DCM) or managed by the AP (in DCM).
Panel Measurement Command: Individual measurements of X or Y position and Z1 or Z2 pressure measurements.
Combined Measurement Command: Combinations of PMCs (X and Y, X and Y and Z1, or X and Y and Z1 and
Z2) offered by the MAX11800–MAX11803 and executed in series to reduce AP bus and interrupt activity.
2
or 100k .
C/SPI Interface
TOUCH
TOUCH
DEFINITION
). See Figure 5 for configuration and measurement details.
). See Figure 5 for configuration and measurement details.