HFCT-5208EMZ Avago Technologies US Inc., HFCT-5208EMZ Datasheet - Page 14

• Manufacturer Part Number: HFCT-5208EMZ
• Description: TXRX 1X9 622MBIT/S SONET/SDH ATM
• Manufacturer: Avago Technologies US Inc.

Specifications of HFCT-5208EMZ

• Data Rate: 622Mbps
• Wavelength: 1300nm
• Applications: General Purpose
• Voltage - Supply: 4.75 V ~ 5.25 V
• Connector Type: SC
• Mounting Type: Through Hole
• Function: Designed for implement a range of solutions for ATM/SONET STS-12/SDH, STM-4 Application.
• Product: Transceiver
• Maximum Rise Time: 1.25 ns
• Maximum Fall Time: 1.25 ns
• Pulse Width Distortion: 0.04 ns
• Maximum Output Current: 50 mA
• Operating Supply Voltage: 4.75 V to 5.25 V
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• For Use With: Singlemode Glass
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

HFBR-5208xxxZ Family, 1300 nm LED
Receiver Optical Characteristics
(T
(T
Notes:
10. This specification is intended to indicate the performance of the receiver section of the transceiver when the input power ranges from the
14
Parameter
Minimum Input Optical Power at window edge
Minimum Input Optical Power at eye center
Input Optical Power Maximum
Input Operating Wavelength
Systematic Jitter Contributed by the Receiver
Random Jitter Contributed by the Receiver
Signal Detect - Asserted
Signal Detect - Deasserted
Signal Detect - Hysteresis
A
A
= 0°C to +70°C, V
= -40°C to +85°C, V
minimum level (with a window time-width) to the maximum level. Over this range the receiver is guaranteed to provide output data with a
Bit Error Ratio (BER) better than or equal to 1 x 10
1.
atic (SJ) and randomjitter (RJ). The worst-case maximum input SJ = 0.5 ns peak-to-peak and the RJ = 0.15 ns peak-to-
peak per ANSI T1.646a standard. Since the input (transmitter) random jitter contribution is very small and difficult to
produce exactly, only the maximum systematic jitter is produced and used for testing the receiver. The corresponding re-
ceiver test window time-width must meet the requirement of 0.31 ns or larger. This worst-case test window time-width
results from the following jitter equation: Minimum Test Window Time-Width = Baud Interval - Tx SJ max. - Rx SJ max. - Rx RJ max.
espectively, Minimum Test Window Time-Width = 1.608 ns - 0.50 ns - 0.30 ns - 0.48 ns = 0.328 ns.
This is a test method that is within practical test error of the worst-case 0.31 ns limit.
receiver sections of the transceiver.
CC
CC
= 4.75 to 5.25 V. Typical @+25°C, 5 V)
23
-1 PRBS data pattern with 72 “1”s and 72 “0”s inserted per the CCITT (now ITU-T) recommendation G.958 Appendix
= 4.75 to 5.25 V. Typical @+25°C, 5 V for A specification part)
-10
Symbol
P
(W)
P
P
l
SJ
RJ
P
P
P
A
A
IN
IN
IN
D
- P
MIN
MIN (C)
MAX
D
Minimum
-14
1270
P
-45
1.0
D
+1.0 dB
Typical
-29.0
-30.5
-11
0.1
0.25
-30.5
-33.7
3.2
Maximum
-26
1380
0.30
0.48
-28
5
Unit
dBm avg.
dBm avg.
dBm avg.
nm
ns p-p
ns p-p
dBm avg.
dBm avg.
dB
Notes
10
Fig 2
10
Fig 2,3
10
-