TLP2631(F) Toshiba, TLP2631(F) Datasheet - Page 61
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TLP2631(F)
Manufacturer Part Number
TLP2631(F)
Description
PHOTOCOUPLER DUAL 8-DIP
Manufacturer
Toshiba
Specifications of TLP2631(F)
Voltage - Isolation
2500Vrms
Number Of Channels
2, Unidirectional
Current - Output / Channel
16mA
Data Rate
10MBd
Propagation Delay High - Low @ If
60ns @ 0 ~ 7.5mA
Current - Dc Forward (if)
20mA
Input Type
DC
Output Type
Open Collector
Mounting Type
Through Hole
Package / Case
8-DIP (0.300", 7.62mm)
Configuration
2 Channel
Maximum Baud Rate
10 MBd (Typ)
Maximum Forward Diode Voltage
1.75 V
Maximum Reverse Diode Voltage
5 V
Maximum Power Dissipation
40 mW
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Isolation Voltage
2500 Vrms
Maximum Continuous Output Current
16 mA
Maximum Fall Time
0.03 us
Maximum Forward Diode Current
20 mA
Output Device
Integrated Photo IC
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
TLP2631F
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
2
2
10000000
1000000
100000
140
120
100
140
120
100
10000
GaA As (SH) LED Projected Operating Life Data
GaA As (SH) LED Projected Light Output Degradation Data
80
60
40
20
80
60
40
20
1000
0
0
100
1
1
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
X-3σ
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
1 / K (x10
X
X
–73
100000
100000
5.0
-3
)
61
10000000
1000000
100000
140
120
100
10000
80
60
40
20
1000
0
100
1
227
2.0
Failure criteria light output degradation Δ P O < –30%
I
I
I
I
I
150
F
F
F
F
F
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
1000
0
4.0
I
I
I
I
I
–30
F
F
F
F
F
Ambient Temperature (°C)
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
1 / K (x10
X
–73
100000
5.0
-3
)