ADE7757ARN Analog Devices Inc, ADE7757ARN Datasheet - Page 4

• Manufacturer Part Number: ADE7757ARN
• Description: IC ENERGY METERING 16-SOIC
• Manufacturer: Analog Devices Inc

Specifications of ADE7757ARN

• Rohs Status: RoHS non-compliant
• Input Impedance: 320 KOhm
• Measurement Error: 0.1%
• Voltage - I/o High: 2.4V
• Voltage - I/o Low: 0.8V
• Current - Supply: 5mA
• Voltage - Supply: 4.75 V ~ 5.25 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 16-SOIC (0.154", 3.90mm Width)
• Meter Type: Single Phase

ADE7757
ABSOLUTE MAXIMUM RATINGS
(T
V
V
Analog Input Voltage to AGND
Reference Input Voltage to AGND . . . –0.3 V to V
Digital Input Voltage to DGND . . . . . –0.3 V to V
Digital Output Voltage to DGND . . . . –0.3 V to V
Operating Temperature Range
Storage Temperature Range . . . . . . . . . . . . –65 C to +150 C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150 C
16-Lead Plastic SOIC, Power Dissipation . . . . . . . . . 350 mW
Lead Temperature, Soldering
NOTES
1
2
Model
ADE7757ARN
ADE7757ARNRL
EVAL-ADE7757EB Evaluation Board
ADE7757ARN-REF Reference Design
TERMINOLOGY
Measurement Error
The error associated with the energy measurement made by the
ADE7757 is defined by the following formula
%
Phase Error between Channels
The HPF (high-pass filter) in the current channel (Channel V1)
has a phase lead response. To offset this phase response and
equalize the phase response between channels, a phase correc-
tion network is also placed in Channel V1. The phase correction
network matches the phase to within 0.1 over a range of 45 Hz
to 65 Hz, and 0.2 over a range 40 Hz to 1 kHz (see Figures
11 and 12).
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
ADE7757 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
JEDEC 1S Standard (2-layer) Board Data.
DD
DD
A
V1P, V1N, V2P, and V2N . . . . . . . . . . . . . . . . –6 V to +6 V
Industrial (A, B Versions) . . . . . . . . . . . . . –40 C to +85 C
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . . 215 C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220 C
Error
= 25 C, unless otherwise noted.)
JA
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Thermal Impedance
Energy Registered by ADE
ORDERING GUIDE
Package Description Package Options
SOIC Narrow-Body
SOIC Narrow-Body
in Reel
2
True Energy
. . . . . . . . . . . . . . . . . . . 124.9 C/W
7757
1
–
True Energy
RN-16
RN-16
Evaluation Board
Reference Design
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
100%
–4–
Power Supply Rejection
This quantifies the ADE7757 measurement error as a percent-
age of reading when the power supplies are varied.
For the ac PSR measurement, a reading at nominal supplies
(5 V) is taken. A 200 mV rms/100 Hz signal is then introduced
onto the supplies and a second reading is obtained under the
same input signal levels. Any error introduced is expressed as a
percentage of reading—see the Measurement Error definition.
For the dc PSR measurement, a reading at nominal supplies
(5 V) is taken. The supplies are then varied 5% and a second
reading is obtained with the same input signal levels. Any error
introduced is again expressed as a percentage of reading.
ADC Offset Error
This refers to the small dc signal (offset) associated with the
analog inputs to the ADCs. However, the HPF in Channel V1
eliminates the offset in the circuitry. Therefore, the power cal-
culation is not affected by this offset.
Frequency Output Error (CF)
The frequency output error of the ADE7757 is defined as the
difference between the measured output frequency (minus
the offset) and the ideal output frequency. The difference is
expressed as a percentage of the ideal frequency. The ideal
frequency is obtained from the ADE7757 transfer function
(see the Transfer Function section).
Gain Error
The gain error of the ADE7757 is defined as the difference
between the measured output frequency (minus the offset) and
the ideal output frequency. The difference is expressed as a
percentage of the ideal frequency. The ideal frequency is obtained
from the ADE7757 transfer function (see the Transfer Function
section).
Oscillator Frequency Tolerance
The oscillator frequency tolerance of the ADE7757 is defined as
part-to-part frequency variation in terms of percentage at room
temperature (25 C). It is measured by taking the difference
between the measured oscillator frequency and the nominal
frequency defined in the Specifications section.
Oscillator Frequency Stability
Oscillator frequency stability is defined as frequency variation
in terms of parts-per-million drift over the operating tem-
perature range. In a metering application, the temperature
range is –40 C to +85 C. Oscillator frequency stability is
measured by taking the difference between the measured
oscillator frequency at –40 C and +85 C and the measured
oscillator frequency at +25 C.
REV. A