CY7C1371D-100AXI Cypress Semiconductor Corp, CY7C1371D-100AXI Datasheet - Page 22

• Manufacturer Part Number: CY7C1371D-100AXI
• Description: IC SRAM 18MBIT 100MHZ 100LQFP
• Manufacturer: Cypress Semiconductor Corp
• Type: Synchronousr

Specifications of CY7C1371D-100AXI

• Memory Size: 18M (512K x 36)
• Package / Case: 100-LQFP
• Format - Memory: RAM
• Memory Type: SRAM - Synchronous
• Speed: 100MHz
• Interface: Parallel
• Voltage - Supply: 3.135 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Access Time: 8.5 ns
• Maximum Clock Frequency: 100 MHz
• Supply Voltage (max): 3.6 V
• Supply Voltage (min): 3.135 V
• Maximum Operating Current: 175 mA
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Number Of Ports: 4
• Operating Supply Voltage: 3.3 V
• Density: 18Mb
• Access Time (max): 8.5ns
• Sync/async: Synchronous
• Architecture: SDR
• Clock Freq (max): 100MHz
• Operating Supply Voltage (typ): 3.3V
• Address Bus: 19b
• Package Type: TQFP
• Operating Temp Range: -40C to 85C
• Supply Current: 175mA
• Operating Supply Voltage (min): 3.135V
• Operating Supply Voltage (max): 3.6V
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 100
• Word Size: 36b
• Number Of Words: 512K
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: CY3716 - ADAPTER SOCKET PTG
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Capacitance
Thermal Resistance
AC Test Loads and Waveforms
Note
Document Number: 38-05556 Rev. *I
C
C
C
19. Tested initially and after any design or process change that may affect these parameters.
Parameter
Parameter
IN
CLK
IO
OUTPUT
OUTPUT
3.3 V IO Test Load


2.5 V IO Test Load
JA
JC
Input capacitance
Clock input capacitance
Input/output capacitance
Thermal resistance
(junction to ambient)
Thermal resistance
(junction to case)
Z
Z
0
0
[19]
= 50 
= 50 
Description
Description
(a)
(a)
V
V
T
T
= 1.25 V
[19]
= 1.5 V
R
R
L
L
= 50 
= 50 
OUTPUT
OUTPUT
T
V
V
Test conditions follow standard
test methods and procedures
for measuring thermal
impedance, according to
EIA/JESD51.
3.3 V
2.5 V
A
DD
DDQ
= 25 C, f = 1 MHz,
INCLUDING
INCLUDING
= 3.3 V
= 2.5 V
Test Conditions
Test Conditions
JIG AND
JIG AND
SCOPE
SCOPE
5 pF
5 pF
(b)
(b)
R = 317 
R = 1667 
R = 351 
R = 1538 
100 TQFP
100 TQFP
Package
Package
28.66
4.08
V
GND
GND
5
5
5
DDQ
V
DDQ
 1ns
 1ns
10%
10%
119 BGA
Package
119 BGA
Package
23.8
6.2
8
8
8
ALL INPUT PULSES
ALL INPUT PULSES
90%
90%
165 FBGA
165 FBGA
Package
Package
(c)
(c)
20.7
4.0
9
9
9
CY7C1371D
CY7C1373D
90%
90%
10%
10%
Page 22 of 33
C/W
C/W
Unit
Unit
pF
pF
pF
 1ns
 1ns
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