AT24C1024B-PU25 Atmel, AT24C1024B-PU25 Datasheet - Page 2

IC EEPROM 1MBIT 1MHZ 8DIP

AT24C1024B-PU25

Manufacturer Part Number
AT24C1024B-PU25
Description
IC EEPROM 1MBIT 1MHZ 8DIP
Manufacturer
Atmel
Datasheet

Specifications of AT24C1024B-PU25

Format - Memory
EEPROMs - Serial
Memory Type
EEPROM
Memory Size
1M (128K x 8)
Speed
1MHz
Interface
I²C, 2-Wire Serial
Voltage - Supply
2.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
8-DIP (0.300", 7.62mm)
Organization
128 K x 8
Interface Type
2-Wire
Maximum Clock Frequency
1 MHz
Access Time
550 ns
Supply Voltage (max)
5.5 V
Supply Voltage (min)
1.8 V
Maximum Operating Current
3 mA
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
Minimum Operating Temperature
- 40 C
Operating Supply Voltage
3.3 V, 5 V
Memory Configuration
131072 X 8
Clock Frequency
1MHz
Supply Voltage Range
1.8V To 5.5V
Memory Case Style
DIP
No. Of Pins
8
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT24C1024B-PU25
Manufacturer:
ATMEL
Quantity:
1 011
1. Absolute Maximum Ratings*
2
Operating Temperature..................................–55°C to +125°C
Storage Temperature .....................................–65°C to +150°C
Voltage on Any Pin
with Respect to Ground .................................... –1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT24C1024B
Table 0-1.
Pin Name
SDA
SCL
WP
NC
A1
A2
Pin Configurations
Function
Address Input
Address Input
Serial Data
Serial Clock Input
Write Protect
No Connect
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
5194F–SEEPR–1/08

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