SST25VF016B-50-4I-QAF Microchip Technology, SST25VF016B-50-4I-QAF Datasheet - Page 27

IC FLASH SER 16M 50MHZ SPI 8WSON

SST25VF016B-50-4I-QAF

Manufacturer Part Number
SST25VF016B-50-4I-QAF
Description
IC FLASH SER 16M 50MHZ SPI 8WSON
Manufacturer
Microchip Technology

Specifications of SST25VF016B-50-4I-QAF

Memory Type
FLASH
Memory Size
16M (2M x 8)
Operating Temperature
-40°C ~ 85°C
Package / Case
8-WSON
Format - Memory
FLASH
Speed
50MHz
Interface
SPI Serial
Voltage - Supply
2.7 V ~ 3.6 V
Architecture
Sectored
Interface Type
4-Wire
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.7 V
Maximum Operating Current
15 mA
Mounting Style
SMD/SMT
Organization
4 KB x 512
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SST25VF016B-50-4I-QAF
Manufacturer:
AD
Quantity:
1 200
A Microchip Technology Company
©2011 Silicon Storage Technology, Inc.
Figure 26:AC Input/Output Reference Waveforms
Figure 27:A Test Load Example
AC test inputs are driven at V
surement reference points for inputs and outputs are V
and fall times (10%
V IHT
V ILT
INPUT
TO DUT
90%) are <5 ns.
IHT
V HT
V LT
(0.9V
27
DD
REFERENCE POINTS
) for a logic “1” and V
TO TESTER
16 Mbit SPI Serial Flash
HT
(0.6V
V HT
V LT
ILT
DD
1271 TstLd.0
C
(0.1V
) and V
L
Note: V
DD
LT
SST25VF016B
) for a logic “0”. Mea-
V
V
V
OUTPUT
LT
IHT
ILT
HT
(0.4V
- V
- V
- V
- V
LOW
HIGH
INPUT
INPUT
DD
S71271-04-000
1271 IORef.0
Test
). Input rise
Test
LOW Test
HIGH Test
Data Sheet
01/11

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