CY62126EV30LL-45ZSXI Cypress Semiconductor Corp, CY62126EV30LL-45ZSXI Datasheet - Page 7

IC SRAM 1MBIT 45NS 44TSOP

CY62126EV30LL-45ZSXI

Manufacturer Part Number
CY62126EV30LL-45ZSXI
Description
IC SRAM 1MBIT 45NS 44TSOP
Manufacturer
Cypress Semiconductor Corp
Type
Asynchronousr
Datasheet

Specifications of CY62126EV30LL-45ZSXI

Memory Size
1M (64K x 16)
Package / Case
44-TSOP II
Format - Memory
RAM
Memory Type
SRAM
Speed
45ns
Interface
Parallel
Voltage - Supply
2.2 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Access Time
45 ns
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.2 V
Maximum Operating Current
16 mA
Organization
64 K x 16
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Number Of Ports
1
Operating Supply Voltage
2.5 V or 3.3 V
Memory Configuration
64K X 16
Supply Voltage Range
2.2V To 3.6V
Memory Case Style
TSOP
No. Of Pins
44
Operating Temperature Range
-40°C To +85°C
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
428-2063
CY62126EV30LL-45ZSXI

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Switching Characteristics
Over the Operating Range
Document #: 38-05486 Rev. *H
Read Cycle
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Write Cycle
t
t
t
t
t
t
t
t
t
t
t
Notes
RC
AA
OHA
ACE
DOE
LZOE
HZOE
LZCE
HZCE
PU
PD
DBE
LZBE
HZBE
WC
SCE
AW
HA
SA
PWE
BW
SD
HD
HZWE
LZWE
11. Test conditions assume signal transition time of 3 ns or less, timing reference levels of V
12. AC timing parameters are subject to byte enable signals (BHE or BLE) not switching when chip is disabled. See
13. At any temperature and voltage condition, t
14. t
15. The internal write time of the memory is defined by the overlap of WE, CE = V
Parameter
I
signals can terminate a write by going inactive. The data input setup and hold timing must refer to the edge of signal that terminates write.
OL
HZOE
/I
OH
, t
and 30-pF load capacitance.
HZCE
[15]
, t
HZBE
Read cycle time
Address to data valid
Data hold from address change
CE LOW to data valid
OE LOW to data valid
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
CE LOW to power up
CE HIGH to power down
BHE / BLE LOW to data valid
BHE / BLE LOW to Low Z
BHE / BLE HIGH to High Z
Write cycle time
CE LOW to write end
Address setup to write end
Address hold from write end
Address setup to write start
WE pulse width
BHE / BLE pulse width
Data setup to write end
Data hold from write end
WE LOW to High Z
WE HIGH to Low Z
, and t
HZWE
[11, 12]
transitions are measured when the outputs enter a high impedance state.
Description
[13]
[13]
HZCE
[13, 14]
[13, 14]
[13]
[13, 14]
is less than t
[13]
[13, 14]
LZCE
, t
HZBE
is less than t
45 ns (Industrial)
Min
45
10
10
45
35
35
35
35
25
10
5
0
5
0
0
0
IL
, BHE, BLE or both = V
LZBE
CC(typ)
, t
Max
HZOE
45
45
22
18
18
45
22
18
18
/2, input pulse levels of 0 to V
is less than t
IL
. All signals must be active to initiate a write and any of these
55 ns (Automotive)
Min
55
10
10
55
40
40
40
40
25
10
LZOE
5
0
5
0
0
0
application note AN13842
, and t
CY62126EV30 MoBL
CC(typ)
HZWE
Max
is less than t
55
55
25
20
20
55
25
20
20
, and output loading of the specified
for further clarification.
LZWE
Unit
for any device.
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Page 7 of 16

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