GLS36VF1601G-70-4I-L1PE Greenliant, GLS36VF1601G-70-4I-L1PE Datasheet - Page 2

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GLS36VF1601G-70-4I-L1PE

Manufacturer Part Number
GLS36VF1601G-70-4I-L1PE
Description
Flash 16M Flash 1M SRAM Industrial Temp
Manufacturer
Greenliant
Datasheet

Specifications of GLS36VF1601G-70-4I-L1PE

Rohs
yes
Memory Type
Flash
Memory Size
16 Mbit
Timing Type
Asynchronous
Access Time
70 ns
Supply Voltage - Max
3.6 V
Supply Voltage - Min
2.7 V
Maximum Operating Current
15 mA
Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
LFBGA-48
Data Sheet
is less than alternative flash technologies. These devices
also improve flexibility while lowering the cost for program,
data, and configuration storage applications.
SuperFlash technology provides fixed Erase and Program
times, independent of the number of Erase/Program
cycles that have occurred. Therefore the system software
or hardware does not have to be modified or de-rated as is
necessary with alternative flash technologies, whose
Erase and Program times increase with accumulated
Erase/Program cycles.
To meet high-density, surface-mount requirements, these
devices are offered in 48-ball TFBGA and 48-lead TSOP
packages. See Figures 6 and 7 for pin assignments.
Device Operation
Memory operation functions are initiated using standard
microprocessor write sequences. A command is written by
asserting WE# low while keeping CE# low. The address
bus is latched on the falling edge of WE# or CE#, which-
ever occurs last. The data bus is latched on the rising edge
of WE# or CE#, whichever occurs first.
Auto Low Power Mode
These devices also have the Auto Lower Power mode
which puts them in a near standby mode within 500 ns after
data has been accessed with a valid Read operation. This
reduces the I
CE# is low, the devices exit Auto Low Power mode with
any address transition or control signal transition used to
initiate another Read cycle, with no access time penalty.
©2010 Greenliant Systems, Ltd.
DD
active Read current to 4 µA typically. While
2
Concurrent Read/Write Operation
The dual bank architecture of these devices allows the
Concurrent Read/Write operation whereby the user can
read from one bank while programming or erasing in the
other bank. For example, reading system code in one bank
while updating data in the other bank.
TABLE 1: Concurrent Read/Write State
Note: For the purposes of this table, write means to perform Block-
Read Operation
The Read operation is controlled by CE# and OE#; both
have to be low for the system to obtain data from the out-
puts. CE# is used for device selection. When CE# is high,
the chip is deselected and only standby power is con-
sumed. OE# is the output control and is used to gate data
from the output pins. The data bus is in a high impedance
state when either CE# or OE# is high. Refer to the Read
cycle timing diagram for further details (Figure 8).
16 Mbit Concurrent SuperFlash
No Operation
No Operation
or Sector-Erase or Program operations as applicable to the
appropriate bank.
Bank 1
Read
Read
Write
Write
GLS36VF1601E / GLS36VF1602E
No Operation
No Operation
Bank 2
Write
Read
Read
Write
S71274-05-000
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