LFX125EB-04FH516C Lattice, LFX125EB-04FH516C Datasheet - Page 59
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LFX125EB-04FH516C
Manufacturer Part Number
LFX125EB-04FH516C
Description
FPGA - Field Programmable Gate Array Use LFX125EB-04F516C
Manufacturer
Lattice
Datasheet
1.LFX125EB-04F256C.pdf
(115 pages)
Specifications of LFX125EB-04FH516C
Number Of Gates
139 K
Number Of Logic Blocks
1936
Number Of I/os
22
Operating Supply Voltage
2.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
FPBGA-516
Minimum Operating Temperature
0 C
Factory Pack Quantity
135
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Lattice Semiconductor
Switching Test Conditions
Figure 25 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 7.
Figure 25. Output Test Load, LVTTL and LVCMOS Standards
Table 7. Text Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
Default LVCMOS 1.8 I/O (Z -> H)
Default LVCMOS 1.8 I/O (Z -> L)
Default LVCMOS 1.8 I/O (H -> Z)
Default LVCMOS 1.8 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
Device
Output
*C
L
includes test fixture and probe capacitance.
106
106
106
R
∞
∞
1
106
106
106
R
∞
∞
2
35pF
35pF
35pF
5pF
5pF
C
L
V
R 1
R 2
59
CCO
LVCMOS 3.3 = V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
Timing Reference
C L *
V
V
OL
OH
0.9V
0.9V
+ 0.3
- 0.3
Point
Test
CCO
CCO
CCO
ispXPGA Family Data Sheet
/2
/2
/2
LVCMOS 1.8 = 1.65V
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
VCCO
1.65V
1.65V
1.65V
1.65V
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