MK20DN512VLL10 Freescale Semiconductor, MK20DN512VLL10 Datasheet - Page 22

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MK20DN512VLL10

Manufacturer Part Number
MK20DN512VLL10
Description
ARM Microcontrollers - MCU Kinetis 512K
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MK20DN512VLL10

Rohs
yes
Core
ARM Cortex M4
Processor Series
MK20DN512
Data Bus Width
32 bit
Maximum Clock Frequency
100 MHz
Program Memory Size
512 KB
Data Ram Size
128 KB
On-chip Adc
Yes
Operating Supply Voltage
1.71 V to 3.6 V
Operating Temperature Range
- 40 C to + 105 C
Package / Case
LQFP-100
Mounting Style
SMD/SMT
A/d Bit Size
16 bit
A/d Channels Available
2
Interface Type
CAN, I2C, I2S, SPI, UART, USB
Maximum Operating Temperature
+ 105 C
Minimum Operating Temperature
- 40 C
Number Of Timers
2
On-chip Dac
Yes
Program Memory Type
Flash
Supply Voltage - Max
3.6 V
Supply Voltage - Min
1.71 V

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MK20DN512VLL10
Manufacturer:
FREESCALE
Quantity:
450
Part Number:
MK20DN512VLL10
0
Peripheral operating requirements and behaviors
1.
2.
3.
4.
6 Peripheral operating requirements and behaviors
6.1 Core modules
6.1.1 Debug trace timing specifications
22
Board type
Symbol
T
T
T
T
T
T
T
cyc
wh
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air), or EIA/JEDEC Standard JESD51-6, Integrated Circuit Thermal Test Method
Environmental Conditions—Forced Convection (Moving Air).
Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental
Conditions—Junction-to-Board.
Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate
temperature used for the case temperature. The value includes the thermal resistance of the interface material
between the top of the package and the cold plate.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air).
wl
s
h
r
f
Clock period
Low pulse width
High pulse width
Clock and data rise time
Clock and data fall time
Data setup
Data hold
Description
Ψ
Symbol
JT
Table 12. Debug trace operating behaviors
Figure 3. TRACE_CLKOUT specifications
K20 Sub-Family Data Sheet, Rev. 2, 12/2012.
Thermal
characterization
parameter, junction
to package top
outside center
(natural
convection)
Description
2
100 LQFP
Frequency dependent
Min.
°C/W
Unit
2
2
3
2
Freescale Semiconductor, Inc.
Max.
3
3
4
Notes
MHz
Unit
ns
ns
ns
ns
ns
ns

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