HCTS365HMSR INTERSIL [Intersil Corporation], HCTS365HMSR Datasheet

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HCTS365HMSR

Manufacturer Part Number
HCTS365HMSR
Description
Radiation Hardened Hex Buffer/Line Driver Non-Inverting
Manufacturer
INTERSIL [Intersil Corporation]
Datasheet
September 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Latch-Up Free Under Any Conditions
• Fanout (Over Temperature Range)
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
• Input Current Levels Ii
Description
The Intersil HCTS365MS is a Radiation Hardened non-
inverting hex buffer and line driver with Tri-state outputs. The
output enables (OE1 and OE2) control the three-state out-
puts. If either OE1 or OE2 is high the outputs will be in a
High impedance state. For Data, OE1 and OE2 must be
Low.
The HCTS365MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family
Ordering Information
HCTS365DMSR
HCTS365KMSR
HCTS365D/Sample
HCTS365K/Sample
HCTS365HMSR
Bit-Day (Typ)
- Bus Driver Outputs: 15 LSTTL Loads
- VIL = 0.8V Max
- VIH = VCC/2 Min
PART NUMBER
10
RAD (Si)/s 20ns Pulse
5 A @ VOL, VOH
TEMPERATURE RANGE
12
o
C to +125
RAD (Si)/s
-55
-55
o
o
C to +125
C to +125
+25
+25
+25
o
o
o
o
C
C
C
C
2
/mg
-9
o
o
C
C
Errors/
1
Pinouts
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
HCTS365MS
Hex Buffer/Line Driver Non-Inverting
GND
OE1
SCREENING LEVEL
A1
Y1
A2
Y2
A3
Y3
MIL-STD-1835 CDFP4-F16, LEAD FINISH C
MIL-STD-1835 CDIP2-T16, LEAD FINISH C
FLATPACK PACKAGE (FLATPACK)
16 LEAD CERAMIC DUAL-IN-LINE
16 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
GND
OE1
A1
A2
A3
Y1
Y2
Y3
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
TOP VIEW
TOP VIEW
Radiation Hardened
16 Lead SBDIP
16 Lead Ceramic Flatpack
16 Lead SBDIP
16 Lead Ceramic Flatpack
Die
16
15
14
13
12
11
10
9
16
15
14
13
12
11
10
Spec Number
9
File Number
PACKAGE
VCC
OE2
A6
Y6
A5
Y5
A4
Y4
VCC
OE2
A6
Y6
A5
Y5
A4
Y4
518637
3070.1

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HCTS365HMSR Summary of contents

Page 1

... CMOS/SOS Logic Family Ordering Information PART NUMBER TEMPERATURE RANGE HCTS365DMSR HCTS365KMSR HCTS365D/Sample HCTS365K/Sample HCTS365HMSR CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999 HCTS365MS Hex Buffer/Line Driver Non-Inverting Pinouts MIL-STD-1835 CDIP2-T16, LEAD FINISH C 2 ...

Page 2

Functional Diagram 1 OE1 15 OE2 OE1 HCTS365MS ONE OF THE IDENTICAL CIRCUITS TRUTH TABLE INPUTS OE2 ...

Page 3

Absolute Maximum Ratings Supply Voltage (VCC -0.5V to +7.0V Input Voltage Range, All Inputs . . ...

Page 4

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Data to Output TPLH VCC = 4.5V TPHL VCC = 4.5V Enable to Output TPZL VCC = 4.5V TPZH VCC = 4.5V Disable to Output TPLZ VCC = 4.5V TPHZ VCC = ...

Page 5

TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) PARAMETER SYMBOL Input Leakage Current IIN VCC = 5.5V, VIN = VCC or GND Three-State Output IOZ VCC = 5.5V, Applied Voltage = 0V or VCC Leakage Current Noise Immunity FN ...

Page 6

CONFORMANCE GROUPS METHOD Group E Subgroup 2 5005 NOTE: 1. Except FN test which will be performed 100% Go/No-Go. TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS OPEN GROUND STATIC BURN-IN I TEST CONNECTIONS (Note ...

Page 7

Intersil Space Level Product Flow - ‘MS’ Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method ...

Page 8

AC Timing Diagrams VIH INPUT VS VIL TPLH VOH VS OUTPUT VOL TTLH VOH 80% 20% OUTPUT VOL AC VOLTAGE LEVELS PARAMETER HCTS VCC 4.50 VIH 3.00 VS 1.30 VIL 0 GND 0 Three-State Low Timing Diagrams VIH INPUT VS ...

Page 9

Three-State High Timing Diagrams VIH INPUT VS VIL TPZH VOH VT OUTPUT VOZ THREE-STATE HIGH VOLTAGE LEVELS PARAMETER HCTS VCC 4.50 VIH 3.00 VS 1.30 VT 1.30 VW 3.60 GND 0 All Intersil semiconductor products are manufactured, assembled and tested ...

Page 10

Die Characteristics DIE DIMENSIONS: 108 x 106 mils METALLIZATION: Type: AlSi Å Å Metal Thickness: 11k 1k GLASSIVATION: Type: SiO 2 Å Å Thickness: 13k 2.6k WORST CASE CURRENT DENSITY <2 A/cm BOND PAD SIZE: 100 ...

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