K4M56323LE-MC1H SAMSUNG [Samsung semiconductor], K4M56323LE-MC1H Datasheet - Page 6
K4M56323LE-MC1H
Manufacturer Part Number
K4M56323LE-MC1H
Description
2M x 32Bit x 4 Banks Mobile SDRAM in 90FBGA
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet
1.K4M56323LE-MC1H.pdf
(12 pages)
K4M56323LE - M(E)E/N/S/C/L/R
AC OPERATING TEST CONDITIONS
Output
AC input levels (Vih/Vil)
Input timing measurement reference level
Input rise and fall time
Output timing measurement reference level
Output load condition
Figure 1. DC Output Load Circuit
500Ω
Parameter
VDDQ
500Ω
30pF
VOH (DC) = VDDQ - 0.2V, IOH = -0.1mA
VOL (DC) = 0.2V, IOL = 0.1mA
(V
DD
= 2.5V ± 0.2V, T
0.9 x V
Output
See Figure 2
0.5 x V
0.5 x V
tr/tf = 1/1
Value
A
= -25 to 85°C for Extended, -25 to 70°C for Commercial)
DDQ
Figure 2. AC Output Load Circuit
DDQ
DDQ
/ 0.2
Z0=50Ω
Mobile-SDRAM
Vtt=0.5 x VDDQ
50Ω
30pF
Unit
ns
February 2004
V
V
V