HCC4536 STMICROELECTRONICS [STMicroelectronics], HCC4536 Datasheet - Page 12

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HCC4536

Manufacturer Part Number
HCC4536
Description
PROGRAMMABLE TIMER
Manufacturer
STMICROELECTRONICS [STMicroelectronics]
Datasheet
HCC/HCF4536B
FUNCTIONAL TEST SEQUENCE
Test Function has been included for the reduction of
test time required to exercise all 24 counter stages.
This test function divides the counter into three 8-
stage section and 255 counts are loaded in each of
the 8-stage sections in parallel. All flip-flops are now
TEST CIRCUITS
Quiescent Device Current.
12/17
I n1
1
1
0
1
0
0
0
1
0
Set
0
1
1
1
1
0
0
0
Inputs
Reset
1
1
1
1
1
0
0
0
8-Bypass
1
1
1
1
1
0
0
0
Functional Test Sequence
Q 1 Thru Q 2 4
Decade Out
Outputs
0
0
0
1
1
1
0
at a ”1”. The counter is now returned to the normal
24-steps in series configuration. One more pulse is
entered into In
from an all ”1” state to an all ”0” state.
Input Voltage.
Counter is in three 8-stage section in parallel
mode.
First ”1” to ”0” Transition of Clock
255 ”1” to ”0” transitions are clocked in the
counter.
The 255 ”1” to ”0” Transition
Counter converted back to 24 stages in series
mode.
Set and Reset must be connected together and
simultaneoulsy go from ”1” to ”0”.
In
Counter Ripples from an all ”1” state to an all ”0”
state.
1
switches to a ”1”.
All 2 4 steps a r e in reset mode.
1
which will cause the counter to ripple
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