AT49LH00B4-33TC ATMEL [ATMEL Corporation], AT49LH00B4-33TC Datasheet - Page 26

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AT49LH00B4-33TC

Manufacturer Part Number
AT49LH00B4-33TC
Description
4-megabit Top Boot, Bottom Partitioned Firmware Hub and Low-Pin Count Flash Memory
Manufacturer
ATMEL [ATMEL Corporation]
Datasheet
Absolute Maximum Ratings*
Notes:
Operating Conditions
Temperature and V
Note:
Power Supply Specifications – All Interfaces
Notes:
26
Voltage on Any Pin ...................-0.5V to +VCC + 0.5V
Symbol
T
V
Symbol
V
I
I
I
I
CCSL1
CCSL2
CCA
PP
C
CC
LKO
1. All specified voltages are with respect to GND. During transitions, this level may undershoot to -2.0V for periods of <20 ns.
2. Do not violate processor or chipset limitations on the INIT pin.
1. The device is designed to operate at temperatures beyond the normal commercial temperature range of 0° C to +70° C.
1. All currents are in RMS unless otherwise noted. These currents are valid for all packages.
2. V
AT49LH00B4
During transitions, this level may overshoot to V
IH
= 0.9 V
Parameter
Operating Temperature
V
Parameter
V
V
Interface)
V
Interface)
V
(FWH/LPC Interface)
Program or Erase Current
CC
CC
CC
CC
CC
CC
CC
Supply Voltage
Lockout Voltage
Standby Current (FWH/LPC
Standby Current (FWH/LPC
Active Read Current
, V
IL
= 0.1 V
CC
per the PCI output V
(1)
(1)(2)
Conditions
Voltage range of all inputs is V
V
V
f
No internal operations in progress
FWH4/ LFRAME = V
V
f
No internal operations in progress
V
FWH4/ LFRAME = V
f
I
V
CLK
CLK
CLK
OUT
IL
CC
CC
CC
CC
CC
, FWH4/ LFRAME = V
OH
= 33 MHz
= 33 MHz
= 33 MHz
= 3.6V,
= 3.6V,
= V
= V
= 0 mA
+ 2.0V for periods <20 ns.
and V
Test Condition
Case Temperature
CC
CC
*NOTICE:
Max,
Max
OL
spec.
IL
IL
Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional oper-
ation of the device at these or any other conditions
beyond those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect device reliability.
(2)
(2)
IH
,
(2)
IH
to
Min
3.0
0
Min
1.5
Max
+85
3.6
Max
35
20
60
2
3379B–FLASH–9/03
Units
Unit
° C
mA
mA
mA
µA
V
V

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